Exploring the origin of tip-enhanced Raman scattering; preparation of efficient TERS probes with high yield

Mehdi Asghari-Khiavi, Bayden Wood, Pejman Hojatitalemi, Andrew Downes, Donald McNaughton, Adam Mechler

Research output: Contribution to journalArticleResearchpeer-review

Abstract

Tip-enhanced Raman scattering (TERS) spectroscopy is a promising technique for nanoscale chemical analysis. However, there are several challenges preventing widespread application of this technology, including reproducible fabrication of efficient TERS probes. These problems reflect a lack of clear understanding of the origins of, and the parameters influencing TERS. It is believed that the coating characteristics at the apex of the tip have a major effect on the near-field optical enhancement and thus the TERS activity of a metalized probe. Here we show that the aspect ratio of the tip can play a significant role in the efficiency of TERS probes. We argue that the electrostatic field arising from the lightning-rod effect has a substantial role in the observed TERS effect. This argument is supported by a??edge-enhanced Raman scatteringa?? which is shown for a noble metal film. Furthermore, it is reported that an associated tip-surface-enhanced Raman scattering effect can be achieved by using a TERS-inactive metalized probe on a surface-enhanced Raman spectroscopy-inactive roughened surface. This observation can be explained by an interparticle enhancement of the electromagnetic field.
Original languageEnglish
Pages (from-to)173 - 180
Number of pages8
JournalJournal of Raman Spectroscopy
Volume43
Issue number2
DOIs
Publication statusPublished - 2012

Cite this

Asghari-Khiavi, Mehdi ; Wood, Bayden ; Hojatitalemi, Pejman ; Downes, Andrew ; McNaughton, Donald ; Mechler, Adam. / Exploring the origin of tip-enhanced Raman scattering; preparation of efficient TERS probes with high yield. In: Journal of Raman Spectroscopy. 2012 ; Vol. 43, No. 2. pp. 173 - 180.
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Exploring the origin of tip-enhanced Raman scattering; preparation of efficient TERS probes with high yield. / Asghari-Khiavi, Mehdi; Wood, Bayden; Hojatitalemi, Pejman; Downes, Andrew; McNaughton, Donald; Mechler, Adam.

In: Journal of Raman Spectroscopy, Vol. 43, No. 2, 2012, p. 173 - 180.

Research output: Contribution to journalArticleResearchpeer-review

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AB - Tip-enhanced Raman scattering (TERS) spectroscopy is a promising technique for nanoscale chemical analysis. However, there are several challenges preventing widespread application of this technology, including reproducible fabrication of efficient TERS probes. These problems reflect a lack of clear understanding of the origins of, and the parameters influencing TERS. It is believed that the coating characteristics at the apex of the tip have a major effect on the near-field optical enhancement and thus the TERS activity of a metalized probe. Here we show that the aspect ratio of the tip can play a significant role in the efficiency of TERS probes. We argue that the electrostatic field arising from the lightning-rod effect has a substantial role in the observed TERS effect. This argument is supported by a??edge-enhanced Raman scatteringa?? which is shown for a noble metal film. Furthermore, it is reported that an associated tip-surface-enhanced Raman scattering effect can be achieved by using a TERS-inactive metalized probe on a surface-enhanced Raman spectroscopy-inactive roughened surface. This observation can be explained by an interparticle enhancement of the electromagnetic field.

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