Abstract
The first experimental observation of diffraction from a thin surface layer at a 90° Bragg reflection is reported. A thin (>1 μm) InGaAs film deposited on a GaAs(800) substrate was studied near the 90° Bragg position. Slight, less than 0.1%, difference in the lattice spacing between the layer and the substrate, has allowed, for the first time, a direct and exclusive observation of the diffraction profile from a thin layer as if it was a “free‐standing” thin crystal.
Original language | English |
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Pages (from-to) | 103-108 |
Number of pages | 6 |
Journal | Physica Status Solidi (A) - Applied Research |
Volume | 179 |
Issue number | 1 |
DOIs | |
Publication status | Published - 2000 |