Experimental observation of X-Ray diffraction from a thin crystalline film at a 90° Bragg reflection

Andrei Y U Nikulin, John R Davis, N T Jones, Brian F Usher, A Yu Souvorov, A Freund

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    Abstract

    The first experimental observation of diffraction from a thin surface layer at a 90° Bragg reflection is reported. A thin (>1 μm) InGaAs film deposited on a GaAs(800) substrate was studied near the 90° Bragg position. Slight, less than 0.1%, difference in the lattice spacing between the layer and the substrate, has allowed, for the first time, a direct and exclusive observation of the diffraction profile from a thin layer as if it was a “free‐standing” thin crystal.
    Original languageEnglish
    Pages (from-to)103-108
    Number of pages6
    JournalPhysica Status Solidi (A) - Applied Research
    Volume179
    Issue number1
    DOIs
    Publication statusPublished - 2000

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