Abstract
The experimental characterization of the coherence properties of hard X-ray sources is reported and discussed. The source is described by its Mutual Optical Intensity (MOI). The coherent-mode decomposition is applied to the MOI described by a Gaussian-Schell model. The method allows for a direct, quantitative characterization of the degree of coherence of both synchrotron and laboratory sources. The latter represents the first example of characterizing a low coherence hard x-ray source.
Original language | English |
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Pages (from-to) | 8073 - 8078 |
Number of pages | 6 |
Journal | Optics Express |
Volume | 19 |
Issue number | 9 |
DOIs | |
Publication status | Published - 2011 |