Executing large parameter sweep applications on a Multi-VO testbed

Shahaan Ayyub; David Andrew Abramson; Colin Mathew Enticott; Slavisa Garic; Jefferson Tan

Executing large parameter sweep applications on a Multi-VO testbed

Shahaan Ayyub, David Andrew Abramson, Colin Mathew Enticott, Slavisa Garic, Jefferson Tan

Research output: Chapter in Book/Report/Conference proceeding › Conference Paper › Research › peer-review

Original language	English
Title of host publication	Proceedings of the 7th IEEE International Symposium on Cluster Computing and the Grid
Editors	Bruno Schulze, Rajkuma Buyya, Philippe Navaux, Walfredo Cirne, Vinod Rebello
Place of Publication	Los Alamitos CA USA
Publisher	IEEE, Institute of Electrical and Electronics Engineers
Pages	73 - 82
Number of pages	10
ISBN (Print)	0769528333
Publication status	Published - 2007
Event	IEEE International Conference on Cluster Computing 2007 - Rio de Janeiro Brazil, Los Alamitos CA USA Duration: 1 Jan 2007 → …

Conference

Conference	IEEE International Conference on Cluster Computing 2007
City	Los Alamitos CA USA
Period	1/01/07 → …

Cite this

Ayyub, Shahaan ; Abramson, David Andrew ; Enticott, Colin Mathew et al. / Executing large parameter sweep applications on a Multi-VO testbed. Proceedings of the 7th IEEE International Symposium on Cluster Computing and the Grid. editor / Bruno Schulze ; Rajkuma Buyya ; Philippe Navaux ; Walfredo Cirne ; Vinod Rebello. Los Alamitos CA USA : IEEE, Institute of Electrical and Electronics Engineers, 2007. pp. 73 - 82

@inproceedings{74881b22ca894710a3c9ebfe82f06a11,

title = "Executing large parameter sweep applications on a Multi-VO testbed",

author = "Shahaan Ayyub and Abramson, {David Andrew} and Enticott, {Colin Mathew} and Slavisa Garic and Jefferson Tan",

year = "2007",

language = "English",

isbn = "0769528333",

pages = "73 -- 82",

editor = "Bruno Schulze and Rajkuma Buyya and Philippe Navaux and Walfredo Cirne and Vinod Rebello",

booktitle = "Proceedings of the 7th IEEE International Symposium on Cluster Computing and the Grid",

publisher = "IEEE, Institute of Electrical and Electronics Engineers",

address = "United States of America",

note = "IEEE International Conference on Cluster Computing 2007 ; Conference date: 01-01-2007",

}

Ayyub, S, Abramson, DA, Enticott, CM, Garic, S & Tan, J 2007, Executing large parameter sweep applications on a Multi-VO testbed. in B Schulze, R Buyya, P Navaux, W Cirne & V Rebello (eds), Proceedings of the 7th IEEE International Symposium on Cluster Computing and the Grid. IEEE, Institute of Electrical and Electronics Engineers, Los Alamitos CA USA, pp. 73 - 82, IEEE International Conference on Cluster Computing 2007, Los Alamitos CA USA, 1/01/07.

Executing large parameter sweep applications on a Multi-VO testbed. / Ayyub, Shahaan; Abramson, David Andrew; Enticott, Colin Mathew et al.
Proceedings of the 7th IEEE International Symposium on Cluster Computing and the Grid. ed. / Bruno Schulze; Rajkuma Buyya; Philippe Navaux; Walfredo Cirne; Vinod Rebello. Los Alamitos CA USA: IEEE, Institute of Electrical and Electronics Engineers, 2007. p. 73 - 82.

Research output: Chapter in Book/Report/Conference proceeding › Conference Paper › Research › peer-review

TY - GEN

T1 - Executing large parameter sweep applications on a Multi-VO testbed

AU - Ayyub, Shahaan

AU - Abramson, David Andrew

AU - Enticott, Colin Mathew

AU - Garic, Slavisa

AU - Tan, Jefferson

PY - 2007

Y1 - 2007

UR - http://ieeexplore.ieee.org.ezproxy.lib.monash.edu.au/xpl/tocresult.jsp?isnumber=4215349&isYear=2007

M3 - Conference Paper

SN - 0769528333

SP - 73

EP - 82

BT - Proceedings of the 7th IEEE International Symposium on Cluster Computing and the Grid

A2 - Schulze, Bruno

A2 - Buyya, Rajkuma

A2 - Navaux, Philippe

A2 - Cirne, Walfredo

A2 - Rebello, Vinod

PB - IEEE, Institute of Electrical and Electronics Engineers

CY - Los Alamitos CA USA

T2 - IEEE International Conference on Cluster Computing 2007

Y2 - 1 January 2007

ER -

Executing large parameter sweep applications on a Multi-VO testbed

Conference

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Cite this