Ex and in situ confocal raman studies of organic thin film and its on-working transistors

Qiaoliang Bao, Ye Gan, Jun Li, Chang Ming Li

Research output: Contribution to journal › Article › Research › peer-review

Original language	English
Pages (from-to)	19718 - 19726
Number of pages	9
Journal	Journal of Physical Chemistry C
Volume	112
Issue number	49
DOIs	https://doi.org/10.1021/jp807466e
Publication status	Published - 2008
Externally published	Yes

Access to Document

@article{63bcd689ef244603bce8a43d88434738,

title = "Ex and in situ confocal raman studies of organic thin film and its on-working transistors",

author = "Qiaoliang Bao and Ye Gan and Jun Li and Li, {Chang Ming}",

year = "2008",

doi = "10.1021/jp807466e",

language = "English",

volume = "112",

pages = "19718 -- 19726",

journal = "Journal of Physical Chemistry C",

issn = "1932-7447",

publisher = "American Chemical Society",

number = "49",

}

TY - JOUR

T1 - Ex and in situ confocal raman studies of organic thin film and its on-working transistors

AU - Bao, Qiaoliang

AU - Gan, Ye

AU - Li, Jun

AU - Li, Chang Ming

PY - 2008

Y1 - 2008

UR - http://pubs.acs.org/doi/pdf/10.1021/jp807466e

U2 - 10.1021/jp807466e

DO - 10.1021/jp807466e

M3 - Article

SN - 1932-7447

VL - 112

SP - 19718

EP - 19726

JO - Journal of Physical Chemistry C

JF - Journal of Physical Chemistry C

IS - 49

ER -