Evidence for in-plane tetragonal c-axis in MnxGa1-x thin films using transmission electron microscopy

J. Karel, F. Casoli, P. Lupo, L. Nasi, S. Fabbrici, L. Righi, F. Albertini, C. Felser

Research output: Contribution to journalArticleResearchpeer-review

6 Citations (Scopus)

Abstract

Tetragonal MnxGa1-x (x = 0.70, 0.75) thin films grown on SrTiO3 substrates exhibit perpendicular magnetic anisotropy with coercive fields between 1 and 2 T. Transmission electron microscopy (TEM) and X-ray diffraction (XRD) reveal that 40 nm samples grown at 300-350 °C lead to films with the tetragonal c-axis oriented primarily perpendicular to the film plane but with some fraction of the sample exhibiting the c-axis in the film plane. This structure results in an undesirable secondary magnetic component in the out of plane magnetization. Growth at 300 °C with a reduced thickness or Mn concentration significantly decreases the tetragonal c-axis in the film plane.

Original languageEnglish
Pages (from-to)165-169
Number of pages5
JournalScripta Materialia
Volume114
DOIs
Publication statusPublished - 15 Mar 2016
Externally publishedYes

Keywords

  • Transmission electron microscopy (TEM)
  • Hard magnetic materials
  • Sputtering
  • Atomic force microscopy

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