Evidence for in-plane tetragonal c-axis in MnxGa1-x thin films using transmission electron microscopy

J. Karel; F. Casoli; P. Lupo; L. Nasi; S. Fabbrici; L. Righi; F. Albertini; C. Felser

doi:10.1016/j.scriptamat.2015.11.019

Evidence for in-plane tetragonal c-axis in Mn_xGa_1-x thin films using transmission electron microscopy

J. Karel, F. Casoli, P. Lupo, L. Nasi, S. Fabbrici, L. Righi, F. Albertini, C. Felser

Research output: Contribution to journal › Article › Research › peer-review

6 Citations (Scopus)

Abstract

Tetragonal Mn_xGa_1-x (x = 0.70, 0.75) thin films grown on SrTiO₃ substrates exhibit perpendicular magnetic anisotropy with coercive fields between 1 and 2 T. Transmission electron microscopy (TEM) and X-ray diffraction (XRD) reveal that 40 nm samples grown at 300-350 °C lead to films with the tetragonal c-axis oriented primarily perpendicular to the film plane but with some fraction of the sample exhibiting the c-axis in the film plane. This structure results in an undesirable secondary magnetic component in the out of plane magnetization. Growth at 300 °C with a reduced thickness or Mn concentration significantly decreases the tetragonal c-axis in the film plane.

Original language	English
Pages (from-to)	165-169
Number of pages	5
Journal	Scripta Materialia
Volume	114
DOIs	https://doi.org/10.1016/j.scriptamat.2015.11.019
Publication status	Published - 15 Mar 2016
Externally published	Yes

Keywords

Transmission electron microscopy (TEM)
Hard magnetic materials
Sputtering
Atomic force microscopy

Access to Document

10.1016/j.scriptamat.2015.11.019

Link to publication in Scopus

Cite this

@article{216364930a5d415cae2c29c14ba7c583,

title = "Evidence for in-plane tetragonal c-axis in MnxGa1-x thin films using transmission electron microscopy",

abstract = "Tetragonal MnxGa1-x (x = 0.70, 0.75) thin films grown on SrTiO3 substrates exhibit perpendicular magnetic anisotropy with coercive fields between 1 and 2 T. Transmission electron microscopy (TEM) and X-ray diffraction (XRD) reveal that 40 nm samples grown at 300-350 °C lead to films with the tetragonal c-axis oriented primarily perpendicular to the film plane but with some fraction of the sample exhibiting the c-axis in the film plane. This structure results in an undesirable secondary magnetic component in the out of plane magnetization. Growth at 300 °C with a reduced thickness or Mn concentration significantly decreases the tetragonal c-axis in the film plane.",

keywords = "Transmission electron microscopy (TEM), Hard magnetic materials, Sputtering, Atomic force microscopy",

author = "J. Karel and F. Casoli and P. Lupo and L. Nasi and S. Fabbrici and L. Righi and F. Albertini and C. Felser",

year = "2016",

month = mar,

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doi = "10.1016/j.scriptamat.2015.11.019",

language = "English",

volume = "114",

pages = "165--169",

journal = "Scripta Materialia",

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TY - JOUR

T1 - Evidence for in-plane tetragonal c-axis in MnxGa1-x thin films using transmission electron microscopy

AU - Karel, J.

AU - Casoli, F.

AU - Lupo, P.

AU - Nasi, L.

AU - Fabbrici, S.

AU - Righi, L.

AU - Albertini, F.

AU - Felser, C.

PY - 2016/3/15

Y1 - 2016/3/15

N2 - Tetragonal MnxGa1-x (x = 0.70, 0.75) thin films grown on SrTiO3 substrates exhibit perpendicular magnetic anisotropy with coercive fields between 1 and 2 T. Transmission electron microscopy (TEM) and X-ray diffraction (XRD) reveal that 40 nm samples grown at 300-350 °C lead to films with the tetragonal c-axis oriented primarily perpendicular to the film plane but with some fraction of the sample exhibiting the c-axis in the film plane. This structure results in an undesirable secondary magnetic component in the out of plane magnetization. Growth at 300 °C with a reduced thickness or Mn concentration significantly decreases the tetragonal c-axis in the film plane.

AB - Tetragonal MnxGa1-x (x = 0.70, 0.75) thin films grown on SrTiO3 substrates exhibit perpendicular magnetic anisotropy with coercive fields between 1 and 2 T. Transmission electron microscopy (TEM) and X-ray diffraction (XRD) reveal that 40 nm samples grown at 300-350 °C lead to films with the tetragonal c-axis oriented primarily perpendicular to the film plane but with some fraction of the sample exhibiting the c-axis in the film plane. This structure results in an undesirable secondary magnetic component in the out of plane magnetization. Growth at 300 °C with a reduced thickness or Mn concentration significantly decreases the tetragonal c-axis in the film plane.

KW - Transmission electron microscopy (TEM)

KW - Hard magnetic materials

KW - Sputtering

KW - Atomic force microscopy

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DO - 10.1016/j.scriptamat.2015.11.019

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JO - Scripta Materialia

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