Abstract
Tetragonal MnxGa1-x (x = 0.70, 0.75) thin films grown on SrTiO3 substrates exhibit perpendicular magnetic anisotropy with coercive fields between 1 and 2 T. Transmission electron microscopy (TEM) and X-ray diffraction (XRD) reveal that 40 nm samples grown at 300-350 °C lead to films with the tetragonal c-axis oriented primarily perpendicular to the film plane but with some fraction of the sample exhibiting the c-axis in the film plane. This structure results in an undesirable secondary magnetic component in the out of plane magnetization. Growth at 300 °C with a reduced thickness or Mn concentration significantly decreases the tetragonal c-axis in the film plane.
Original language | English |
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Pages (from-to) | 165-169 |
Number of pages | 5 |
Journal | Scripta Materialia |
Volume | 114 |
DOIs | |
Publication status | Published - 15 Mar 2016 |
Externally published | Yes |
Keywords
- Transmission electron microscopy (TEM)
- Hard magnetic materials
- Sputtering
- Atomic force microscopy