Evaluation of conducted emission test methods for charge pump DC/DC converters

Simon Kennedy, Mehmet Rasit Yuce, Jean-Michel Redoute

Research output: Contribution to journalArticleResearchpeer-review

10 Citations (Scopus)

Abstract

This paper presents conducted emission measurements for a group of commercially available capacitive step-up dc/dc converters. A comparison of the traditional line impedance stabilization network conducted emission method with integrated circuit test methods including Ω, direct and transverse electromagnetic cell methods is presented. The frequency performance and systematic offsets of each method are examined. Relative electromagnetic compatibility of these devices is compared and correlation of results of different methods explored. Improved understanding of the electromagnetic environment improves the potential reliability of electronic systems.

Original languageEnglish
Article number7790820
Pages (from-to)170-177
Number of pages8
JournalIEEE Transactions on Reliability
Volume66
Issue number1
DOIs
Publication statusPublished - 1 Mar 2017

Keywords

  • 1 Ω probe
  • electromagnetic emissions
  • electromagnetic environment
  • integrated circuits (IC)
  • line impedance stabilization network (LISN)
  • transverse electromagnetic (TEM) cell

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