Evaluation of conducted emission test methods for charge pump DC/DC converters

Simon Kennedy; Mehmet Rasit Yuce; Jean-Michel Redoute

doi:10.1109/TR.2016.2633532

Evaluation of conducted emission test methods for charge pump DC/DC converters

Simon Kennedy, Mehmet Rasit Yuce, Jean-Michel Redoute

Electrical and Computer Systems Engineering

Research output: Contribution to journal › Article › Research › peer-review

11 Citations (Scopus)

Abstract

This paper presents conducted emission measurements for a group of commercially available capacitive step-up dc/dc converters. A comparison of the traditional line impedance stabilization network conducted emission method with integrated circuit test methods including Ω, direct and transverse electromagnetic cell methods is presented. The frequency performance and systematic offsets of each method are examined. Relative electromagnetic compatibility of these devices is compared and correlation of results of different methods explored. Improved understanding of the electromagnetic environment improves the potential reliability of electronic systems.

Original language	English
Article number	7790820
Pages (from-to)	170-177
Number of pages	8
Journal	IEEE Transactions on Reliability
Volume	66
Issue number	1
DOIs	https://doi.org/10.1109/TR.2016.2633532
Publication status	Published - 1 Mar 2017

Keywords

1 Ω probe
electromagnetic emissions
electromagnetic environment
integrated circuits (IC)
line impedance stabilization network (LISN)
transverse electromagnetic (TEM) cell

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10.1109/TR.2016.2633532

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KW - electromagnetic environment

KW - integrated circuits (IC)

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KW - transverse electromagnetic (TEM) cell

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Evaluation of conducted emission test methods for charge pump DC/DC converters

Abstract

Keywords

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