Evaluating the performance of different classification algorithms for fabricated semiconductor wafers

Jian Wei Cheng; Po-Leen Ooi; Chris Chan; Ye Chow Kuang; Serge Demidenko

doi:10.1109/DELTA.2010.69

Evaluating the performance of different classification algorithms for fabricated semiconductor wafers

Jian Wei Cheng, Po-Leen Ooi, Chris Chan, Ye Chow Kuang, Serge Demidenko

Malaysia Sch of Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference Paper › Research › peer-review

15 Citations (Scopus)

Original language	English
Title of host publication	Proceedings of the Fifth IEEE International Symposium on Electrical Design, Test and Applications (DELTA 2010)
Editors	Serge Demidenko, Michel Renovell, Mani Soma
Place of Publication	CA USA
Publisher	IEEE, Institute of Electrical and Electronics Engineers
Pages	360 - 366
Number of pages	7
ISBN (Print)	9780769539782
DOIs	https://doi.org/10.1109/DELTA.2010.69
Publication status	Published - 2010
Event	IEEE International Symposium on Electronic Design, Test and Applications (DELTA) 2010 - Ho Chi Minh City, Vietnam Duration: 13 Jan 2010 → 15 Jan 2010 Conference number: 5th https://ieeexplore.ieee.org/xpl/conhome/5438527/proceeding (Proceedings)

Conference

Conference	IEEE International Symposium on Electronic Design, Test and Applications (DELTA) 2010
Abbreviated title	DELTA 2010
Country/Territory	Vietnam
City	Ho Chi Minh City
Period	13/01/10 → 15/01/10
Internet address	https://ieeexplore.ieee.org/xpl/conhome/5438527/proceeding (Proceedings)

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10.1109/DELTA.2010.69

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Cheng, J. W., Ooi, P.-L., Chan, C., Kuang, Y. C., & Demidenko, S. (2010). Evaluating the performance of different classification algorithms for fabricated semiconductor wafers. In S. Demidenko, M. Renovell, & M. Soma (Eds.), Proceedings of the Fifth IEEE International Symposium on Electrical Design, Test and Applications (DELTA 2010) (pp. 360 - 366). IEEE, Institute of Electrical and Electronics Engineers. https://doi.org/10.1109/DELTA.2010.69

Cheng, Jian Wei ; Ooi, Po-Leen ; Chan, Chris et al. / Evaluating the performance of different classification algorithms for fabricated semiconductor wafers. Proceedings of the Fifth IEEE International Symposium on Electrical Design, Test and Applications (DELTA 2010). editor / Serge Demidenko ; Michel Renovell ; Mani Soma. CA USA : IEEE, Institute of Electrical and Electronics Engineers, 2010. pp. 360 - 366

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title = "Evaluating the performance of different classification algorithms for fabricated semiconductor wafers",

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language = "English",

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booktitle = "Proceedings of the Fifth IEEE International Symposium on Electrical Design, Test and Applications (DELTA 2010)",

publisher = "IEEE, Institute of Electrical and Electronics Engineers",

address = "United States of America",

note = "IEEE International Symposium on Electronic Design, Test and Applications (DELTA) 2010, DELTA 2010 ; Conference date: 13-01-2010 Through 15-01-2010",

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Cheng, JW, Ooi, P-L, Chan, C, Kuang, YC & Demidenko, S 2010, Evaluating the performance of different classification algorithms for fabricated semiconductor wafers. in S Demidenko, M Renovell & M Soma (eds), Proceedings of the Fifth IEEE International Symposium on Electrical Design, Test and Applications (DELTA 2010). IEEE, Institute of Electrical and Electronics Engineers, CA USA, pp. 360 - 366, IEEE International Symposium on Electronic Design, Test and Applications (DELTA) 2010, Ho Chi Minh City, Vietnam, 13/01/10. https://doi.org/10.1109/DELTA.2010.69

Evaluating the performance of different classification algorithms for fabricated semiconductor wafers. / Cheng, Jian Wei; Ooi, Po-Leen; Chan, Chris et al.
Proceedings of the Fifth IEEE International Symposium on Electrical Design, Test and Applications (DELTA 2010). ed. / Serge Demidenko; Michel Renovell; Mani Soma. CA USA: IEEE, Institute of Electrical and Electronics Engineers, 2010. p. 360 - 366.

Research output: Chapter in Book/Report/Conference proceeding › Conference Paper › Research › peer-review

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AU - Chan, Chris

AU - Kuang, Ye Chow

AU - Demidenko, Serge

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BT - Proceedings of the Fifth IEEE International Symposium on Electrical Design, Test and Applications (DELTA 2010)

A2 - Demidenko, Serge

A2 - Renovell, Michel

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PB - IEEE, Institute of Electrical and Electronics Engineers

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Y2 - 13 January 2010 through 15 January 2010

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Cheng JW, Ooi PL, Chan C, Kuang YC, Demidenko S. Evaluating the performance of different classification algorithms for fabricated semiconductor wafers. In Demidenko S, Renovell M, Soma M, editors, Proceedings of the Fifth IEEE International Symposium on Electrical Design, Test and Applications (DELTA 2010). CA USA: IEEE, Institute of Electrical and Electronics Engineers. 2010. p. 360 - 366 doi: 10.1109/DELTA.2010.69

Evaluating the performance of different classification algorithms for fabricated semiconductor wafers

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