Evaluating the performance of different classification algorithms for fabricated semiconductor wafers

Jian Wei Cheng, Po-Leen Ooi, Chris Chan, Ye Chow Kuang, Serge Demidenko

    Research output: Chapter in Book/Report/Conference proceedingConference PaperResearchpeer-review

    11 Citations (Scopus)
    Original languageEnglish
    Title of host publicationProceedings of the Fifth IEEE International Symposium on Electrical Design, Test and Applications (DELTA 2010)
    EditorsSerge Demidenko, Michel Renovell, Mani Soma
    Place of PublicationCA USA
    PublisherIEEE, Institute of Electrical and Electronics Engineers
    Pages360 - 366
    Number of pages7
    ISBN (Print)9780769539782
    DOIs
    Publication statusPublished - 2010
    EventIEEE International Symposium on Electronic Design, Test and Applications (DELTA) 2010 - Ho Chi Minh City Vietnam, CA USA
    Duration: 1 Jan 2010 → …

    Conference

    ConferenceIEEE International Symposium on Electronic Design, Test and Applications (DELTA) 2010
    CityCA USA
    Period1/01/10 → …

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