Energy-filtered transmission electron microscopy based on inner-shell ionization

Nathan Lugg, B Freitag, Scott Findlay, Leslie Allen

Research output: Contribution to journalArticleResearchpeer-review

14 Citations (Scopus)

Abstract

We demonstrate that energy-filtered transmission electron microscopy (EFTEM) based on inner-shell ionization can contain atomic resolution information. We present a comparison between experimental data and simulation for the EFTEM image of the N4,5 edge (threshold energy 99. eV) of lanthanum in LaB6 in which direct interpretation of the location of the lanthanum columns is possible. Our first principles approach is based on calculating transition potentials for inelastic scattering. For our case study, the localization of the transition potentials is such that elastic contrast is only weakly preserved in the EFTEM image.
Original languageEnglish
Pages (from-to)981 - 990
Number of pages10
JournalUltramicroscopy
Volume110
Issue number8
DOIs
Publication statusPublished - 2010
Externally publishedYes

Cite this