Enabling knowledge management: a measurement perspective

Kwang K. Lim, Pervaiz K. Ahmed

Research output: Chapter in Book/Report/Conference proceedingConference PaperOtherpeer-review

4 Citations (Scopus)

Abstract

Knowledge Management (KM) has become part of common vocabulary in academic circles as well as in the business world. Whilst an increasing number of companies have embarked upon knowledge management initiatives, it remains unclear the extent to which these programmes have delivered benefits. In this paper we address a very important gap in the field of KM, by providing empirical evidence on KM success or otherwise by focussing in on the issue of measurement. By examining the extent to which companies measure, and the way they measure JCM it becomes possible to ascertain the extent of progress in KM implementation that has hitherto been achieved. The paper end by defining the key obstacles and barrier faced in KM programmes.

Original languageEnglish
Title of host publicationProceedings of the 2000 IEEE International Conference on Management of Innovation and Technology
Subtitle of host publication"Management in the 21st Century", ICMIT 2000
PublisherIEEE, Institute of Electrical and Electronics Engineers
Pages690-695
Number of pages6
ISBN (Electronic)0780366522, 9780780366527
DOIs
Publication statusPublished - 2000
Externally publishedYes
EventManagement of Innovation and Technology International Conference 2000 - Singapore, Singapore
Duration: 12 Nov 200015 Nov 2000
https://ieeexplore.ieee.org/xpl/conhome/7328/proceeding?isnumber=19805 (Proceedings)

Publication series

NameProceedings of the 2000 IEEE International Conference on Management of Innovation and Technology:
Volume2

Conference

ConferenceManagement of Innovation and Technology International Conference 2000
Abbreviated titleICMIT 2000
CountrySingapore
CitySingapore
Period12/11/0015/11/00
Internet address

Keywords

  • Barriers to KM
  • Knowledge management
  • Measurement of knowledge outcomes
  • Survey of knowledge management practice

Cite this