Abstract
This paper describes the electromagnetic susceptibility of an 8 bit current steered thermometer encoded digital to analog converter (DAC) when electromagnetic interference (EMI) is injected into its bias current generator circuit. A theoretical analysis is presented and illustrates how the immunity to EMI can be increased by observing two fundamental design guidelines: these derivations are corroborated with simulations using the UMC 0.18 μm CMOS process.
Original language | English |
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Title of host publication | Proceedings of the Asia-Pacific Microwave Conference 2011 (APMC 2011) |
Subtitle of host publication | Melbourne, VIC, Australia; 5-8 December 2011 |
Editors | Kim Eccleston, Karu Estelle |
Place of Publication | PIscataway NJ USA |
Publisher | IEEE, Institute of Electrical and Electronics Engineers |
Pages | 287-290 |
Number of pages | 4 |
ISBN (Print) | 9780858259744, 9781457720345 |
Publication status | Published - 2011 |
Event | Asia-Pacific Microwave Conference 2011 - Melbourne Convention and Exhibition Centre, Melbourne, Australia Duration: 5 Dec 2011 → 8 Dec 2011 https://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=6170030 (Proceedings) |
Conference
Conference | Asia-Pacific Microwave Conference 2011 |
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Abbreviated title | APMC 2011 |
Country/Territory | Australia |
City | Melbourne |
Period | 5/12/11 → 8/12/11 |
Internet address |
Keywords
- analog integrated circuit design
- digital to analog converters
- electromagnetic compatibility (EMC)
- electromagnetic interference (EMI)