Elemental mapping in scanning transmission electron microscopy

Leslie Allen, Adrian D'Alfonso, Scott Findlay, James LeBeau, Nathan Lugg, Susanne Stemmer

Research output: Chapter in Book/Report/Conference proceedingConference PaperResearchpeer-review

11 Citations (Scopus)

Abstract

We discuss atomic resolution chemical mapping in scanning transmission electron microscopy (STEM) based on core-loss electron energy loss spectroscopy (EELS) and also on energy dispersive X-ray (EDX) imaging. Chemical mapping using EELS can yield counterintuitive results which, however, can be understood using first principles calculations. Experimental chemical maps based on EDX bear out the thesis that such maps are always likely to be directly interpretable. This can be explained in terms of the local nature of the effective optical potential for ionization under those imaging conditions.
Original languageEnglish
Title of host publicationJournal of Physics: Conference Series
EditorsRichard Baker
Place of PublicationBristol UK
PublisherIOP Publishing
Pages1 - 6
Number of pages6
Volume241
ISBN (Print)1742-6596
DOIs
Publication statusPublished - 2010
Externally publishedYes
EventInstitute-of-Physics-Electron-Microscopy and Analysis-Group Conference (EMAG) 2010 - Sheffield UK, Bristol UK
Duration: 1 Jan 2010 → …

Conference

ConferenceInstitute-of-Physics-Electron-Microscopy and Analysis-Group Conference (EMAG) 2010
CityBristol UK
Period1/01/10 → …

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