Abstract
We discuss atomic resolution chemical mapping in scanning transmission electron
microscopy (STEM) based on core-loss electron energy loss spectroscopy (EELS) and also on
energy dispersive X-ray (EDX) imaging. Chemical mapping using EELS can yield counterintuitive
results which, however, can be understood using first principles calculations.
Experimental chemical maps based on EDX bear out the thesis that such maps are always
likely to be directly interpretable. This can be explained in terms of the local nature of the
effective optical potential for ionization under those imaging conditions.
| Original language | English |
|---|---|
| Title of host publication | Journal of Physics: Conference Series |
| Editors | Richard Baker |
| Place of Publication | Bristol UK |
| Publisher | IOP Publishing |
| Pages | 1 - 6 |
| Number of pages | 6 |
| Volume | 241 |
| ISBN (Print) | 1742-6596 |
| DOIs | |
| Publication status | Published - 2010 |
| Externally published | Yes |
| Event | Institute-of-Physics-Electron-Microscopy and Analysis-Group Conference (EMAG) 2010 - Sheffield UK, Bristol UK Duration: 1 Jan 2010 → … |
Conference
| Conference | Institute-of-Physics-Electron-Microscopy and Analysis-Group Conference (EMAG) 2010 |
|---|---|
| City | Bristol UK |
| Period | 1/01/10 → … |