Electronic structure and stability of hexagonal Ba3Ti 2RuO9

Guillaume Radtke; Christian Maunders; Alberto Saul; Sorin Lazar; Harold Whitfield; Joanne Etheridge; Gianluigi Botton

doi:10.1103/PhysRevB.81.085112

Electronic structure and stability of hexagonal Ba3Ti 2RuO9

Guillaume Radtke, Christian Maunders, Alberto Saul, Sorin Lazar, Harold Whitfield, Joanne Etheridge, Gianluigi Botton

Materials Science & Engineering

Research output: Contribution to journal › Article › Research › peer-review

11 Citations (Scopus)

Original language	English
Pages (from-to)	1 - 10
Number of pages	10
Journal	Physical Review B
Volume	81
Issue number	8
DOIs	https://doi.org/10.1103/PhysRevB.81.085112
Publication status	Published - 2010

Access to Document

10.1103/PhysRevB.81.085112

Cite this

@article{2e451b359b724d03b32329671e38b628,

title = "Electronic structure and stability of hexagonal Ba3Ti 2RuO9",

author = "Guillaume Radtke and Christian Maunders and Alberto Saul and Sorin Lazar and Harold Whitfield and Joanne Etheridge and Gianluigi Botton",

year = "2010",

doi = "10.1103/PhysRevB.81.085112",

language = "English",

volume = "81",

pages = "1 -- 10",

journal = "Physical Review B",

issn = "1098-0121",

publisher = "American Physical Society",

number = "8",

}

TY - JOUR

T1 - Electronic structure and stability of hexagonal Ba3Ti 2RuO9

AU - Radtke, Guillaume

AU - Maunders, Christian

AU - Saul, Alberto

AU - Lazar, Sorin

AU - Whitfield, Harold

AU - Etheridge, Joanne

AU - Botton, Gianluigi

PY - 2010

Y1 - 2010

UR - http://prb.aps.org/abstract/PRB/v81/i8/e085112

U2 - 10.1103/PhysRevB.81.085112

DO - 10.1103/PhysRevB.81.085112

M3 - Article

SN - 1098-0121

VL - 81

SP - 1

EP - 10

JO - Physical Review B

JF - Physical Review B

IS - 8

ER -

Electronic structure and stability of hexagonal Ba3Ti 2RuO9

Access to Document

Other files and links

Centre for Electron Microscopy (MCEM)

Cite this

Electronic structure and stability of hexagonal Ba3Ti 2RuO9

Access to Document

Other files and links

Equipment

Centre for Electron Microscopy (MCEM)

Cite this