Electronic properties of modified surfaces using contact and non-contact scanning probe microscopy techniques and SECM

Aaron K. Neufeld, Anthony O'Mullane, Alan M. Bond

Research output: Chapter in Book/Report/Conference proceedingConference PaperResearchpeer-review

Abstract

Electrochemical experiments with tetracyanoquinodimethane (TCNQ) modified electrodes in contact with aqueous copper containing electrolytes leads to the incorporation and expulsion of copper ions. This process occurs concomitantly with nucleation and growth processes and significant crystal fragmentation to produce particles with dimensions of the order of 10's of nanometres. During reduction of TCNQ and intercalation of copper ions, different phases of the semiconducting compound CuTCNQ are formed.[1,2] The preparation of both conducting and insulating substrates coated with electroactive TCNQ and CuTCNQ particles of variable size have been made by dip and spin coating procedures. Results suggest that the phase and hence electronic properties of CuTCNQ is dependent on the size of particles that decorate the electrode surface. Combining atomic force microscope (AFM) based methods that interrogate the morphological and electronic properties of nanometre sized particles with use of a scanning electrochemical microscope (SECM) is a new advance in materials characterisation that has proved highly valuable in understanding the highly complex behaviour of these semi-conducting particles.

Original languageEnglish
Title of host publicationScanning-Probe and Other Novel Microscopies of Local Phenomena in Nanostructured Materials
Pages230-235
Number of pages6
Publication statusPublished - 1 Dec 2004
Event2004 MRS Fall Meeting - Boston, United States of America
Duration: 29 Nov 20042 Dec 2004

Publication series

NameMaterials Research Society Symposium Proceedings
Volume838
ISSN (Print)0272-9172

Conference

Conference2004 MRS Fall Meeting
CountryUnited States of America
CityBoston
Period29/11/042/12/04

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