Electron tomography

Matthew Weyland; Paul A. Midgley

doi:10.1016/S1369-7021(04)00569-3

Electron tomography

Matthew Weyland, Paul A. Midgley

Research output: Contribution to journal › Article › Research › peer-review

132 Citations (Scopus)

Abstract

The applications of HAADF STEM and EFTEM tomography as an imaging and analytical tool for macromolecular structures and three-dimensional (3D) nanostructures are discussed. Electron tomography, as a means to reconstruct three-dimensional objects from a series of two-dimensional projections, is adapted from the life sciences to meet the demands of materials analysis at the nanometer length scale. STEM HAADF shows good resolution and sensitivity, especially to high atomic number particles in a low atomic number matrix. EFTEM imaging is used extensively in biological tomography, not for elemental imaging, but in zero-loss mode in which the spectrometer is used to filter the inelastic scattering.

Original language	English
Pages (from-to)	32-40
Number of pages	9
Journal	Materials Today
Volume	7
Issue number	12
DOIs	https://doi.org/10.1016/S1369-7021(04)00569-3
Publication status	Published - 1 Dec 2004
Externally published	Yes

Access to Document

10.1016/S1369-7021(04)00569-3

Cite this

@article{ef0cb2b339c14787963020061bff6e2e,

title = "Electron tomography",

abstract = "The applications of HAADF STEM and EFTEM tomography as an imaging and analytical tool for macromolecular structures and three-dimensional (3D) nanostructures are discussed. Electron tomography, as a means to reconstruct three-dimensional objects from a series of two-dimensional projections, is adapted from the life sciences to meet the demands of materials analysis at the nanometer length scale. STEM HAADF shows good resolution and sensitivity, especially to high atomic number particles in a low atomic number matrix. EFTEM imaging is used extensively in biological tomography, not for elemental imaging, but in zero-loss mode in which the spectrometer is used to filter the inelastic scattering.",

author = "Matthew Weyland and Midgley, {Paul A.}",

year = "2004",

month = dec,

day = "1",

doi = "10.1016/S1369-7021(04)00569-3",

language = "English",

volume = "7",

pages = "32--40",

journal = "Materials Today",

issn = "1369-7021",

publisher = "Elsevier",

number = "12",

}

TY - JOUR

T1 - Electron tomography

AU - Weyland, Matthew

AU - Midgley, Paul A.

PY - 2004/12/1

Y1 - 2004/12/1

N2 - The applications of HAADF STEM and EFTEM tomography as an imaging and analytical tool for macromolecular structures and three-dimensional (3D) nanostructures are discussed. Electron tomography, as a means to reconstruct three-dimensional objects from a series of two-dimensional projections, is adapted from the life sciences to meet the demands of materials analysis at the nanometer length scale. STEM HAADF shows good resolution and sensitivity, especially to high atomic number particles in a low atomic number matrix. EFTEM imaging is used extensively in biological tomography, not for elemental imaging, but in zero-loss mode in which the spectrometer is used to filter the inelastic scattering.

AB - The applications of HAADF STEM and EFTEM tomography as an imaging and analytical tool for macromolecular structures and three-dimensional (3D) nanostructures are discussed. Electron tomography, as a means to reconstruct three-dimensional objects from a series of two-dimensional projections, is adapted from the life sciences to meet the demands of materials analysis at the nanometer length scale. STEM HAADF shows good resolution and sensitivity, especially to high atomic number particles in a low atomic number matrix. EFTEM imaging is used extensively in biological tomography, not for elemental imaging, but in zero-loss mode in which the spectrometer is used to filter the inelastic scattering.

UR - http://www.scopus.com/inward/record.url?scp=9544244774&partnerID=8YFLogxK

U2 - 10.1016/S1369-7021(04)00569-3

DO - 10.1016/S1369-7021(04)00569-3

M3 - Article

AN - SCOPUS:9544244774

SN - 1369-7021

VL - 7

SP - 32

EP - 40

JO - Materials Today

JF - Materials Today

IS - 12

ER -

Electron tomography

Abstract

Access to Document

Other files and links

Cite this