| Original language | English |
|---|---|
| Title of host publication | Nanocharacterisation |
| Editors | Angus I Kirkland, Sarah J Haigh |
| Place of Publication | Cambridge UK |
| Publisher | The Royal Society of Chemistry |
| Pages | 211 - 299 |
| Number of pages | 89 |
| Edition | 2nd |
| ISBN (Electronic) | 9781782621867, 9781782626886 |
| ISBN (Print) | 9781849738057 |
| DOIs | |
| Publication status | Published - 2015 |
Publication series
| Name | RSC Nanoscience & Nanotechnology |
|---|---|
| Publisher | Royal Society of Chemistry (RSC) |
| Volume | 37 |
| ISSN (Print) | 1757-7136 |
Equipment
Centre for Electron Microscopy (MCEM)
Peter Miller (Manager)
Office of the Vice-Provost (Research and Research Infrastructure)Facility/equipment: Facility
Cite this
Weyland, M., & Midgley, P. A. (2015). Electron tomography. In A. I. Kirkland, & S. J. Haigh (Eds.), Nanocharacterisation (2nd ed., pp. 211 - 299). (RSC Nanoscience & Nanotechnology; Vol. 37). The Royal Society of Chemistry. https://doi.org/10.1039/978178262186700211