Efficient and effective random testing using the Voronoi diagram

Tsong Yueh Chen; Robert Graham Merkel

Efficient and effective random testing using the Voronoi diagram

Tsong Yueh Chen
, Robert Graham Merkel

Research output: Chapter in Book/Report/Conference proceeding › Conference Paper › Research › peer-review

Original language	English
Title of host publication	Proceedings of the 2006 Australian Software Engineering Conference
Editors	Jun Han, Mark Staples
Place of Publication	Los Alamitos CA USA
Publisher	IEEE, Institute of Electrical and Electronics Engineers
Pages	300 - 305
Number of pages	6
ISBN (Print)	0769525512
Publication status	Published - 2006
Externally published	Yes
Event	Australian Software Engineering Conference 2006 - Sydney, Australia Duration: 18 Apr 2006 → 21 Apr 2006 Conference number: 17th https://ieeexplore.ieee.org/xpl/conhome/10753/proceeding (Proceedings)

Conference

Conference	Australian Software Engineering Conference 2006
Abbreviated title	ASWEC 2006
Country/Territory	Australia
City	Sydney
Period	18/04/06 → 21/04/06
Internet address	https://ieeexplore.ieee.org/xpl/conhome/10753/proceeding (Proceedings)

Cite this

@inproceedings{cd3058c2613d47d8b6b77e556a017c13,

title = "Efficient and effective random testing using the Voronoi diagram",

author = "Chen, \{Tsong Yueh\} and Merkel, \{Robert Graham\}",

year = "2006",

language = "English",

isbn = "0769525512",

pages = "300 -- 305",

editor = "Jun Han and Mark Staples",

booktitle = "Proceedings of the 2006 Australian Software Engineering Conference",

publisher = "IEEE, Institute of Electrical and Electronics Engineers",

address = "United States of America",

note = "Australian Software Engineering Conference 2006, ASWEC 2006 ; Conference date: 18-04-2006 Through 21-04-2006",

url = "https://ieeexplore.ieee.org/xpl/conhome/10753/proceeding",

}

Chen, TY & Merkel, RG 2006, Efficient and effective random testing using the Voronoi diagram. in J Han & M Staples (eds), Proceedings of the 2006 Australian Software Engineering Conference. IEEE, Institute of Electrical and Electronics Engineers, Los Alamitos CA USA, pp. 300 - 305, Australian Software Engineering Conference 2006, Sydney, New South Wales, Australia, 18/04/06.

Efficient and effective random testing using the Voronoi diagram. / Chen, Tsong Yueh; Merkel, Robert Graham.
Proceedings of the 2006 Australian Software Engineering Conference. ed. / Jun Han; Mark Staples. Los Alamitos CA USA: IEEE, Institute of Electrical and Electronics Engineers, 2006. p. 300 - 305.

Research output: Chapter in Book/Report/Conference proceeding › Conference Paper › Research › peer-review

TY - GEN

T1 - Efficient and effective random testing using the Voronoi diagram

AU - Chen, Tsong Yueh

AU - Merkel, Robert Graham

N1 - Conference code: 17th

PY - 2006

Y1 - 2006

M3 - Conference Paper

SN - 0769525512

SP - 300

EP - 305

BT - Proceedings of the 2006 Australian Software Engineering Conference

A2 - Han, Jun

A2 - Staples, Mark

PB - IEEE, Institute of Electrical and Electronics Engineers

CY - Los Alamitos CA USA

T2 - Australian Software Engineering Conference 2006

Y2 - 18 April 2006 through 21 April 2006

ER -