Efficient and effective random testing using the Voronoi diagram

Tsong Yueh Chen, Robert Graham Merkel

Research output: Chapter in Book/Report/Conference proceedingConference PaperResearchpeer-review

13 Citations (Scopus)
Original languageEnglish
Title of host publicationProceedings of the 2006 Australian Software Engineering Conference
EditorsJun Han, Mark Staples
Place of PublicationLos Alamitos CA USA
PublisherIEEE, Institute of Electrical and Electronics Engineers
Pages300 - 305
Number of pages6
ISBN (Print)0769525512
Publication statusPublished - 2006
Externally publishedYes
EventAustralian Software Engineering Conference 2006 - Sydney, Australia
Duration: 18 Apr 200621 Apr 2006
Conference number: 17th
https://ieeexplore.ieee.org/xpl/conhome/10753/proceeding (Proceedings)

Conference

ConferenceAustralian Software Engineering Conference 2006
Abbreviated titleASWEC 2006
Country/TerritoryAustralia
CitySydney
Period18/04/0621/04/06
Internet address

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