Efficient and effective random testing using the Voronoi diagram

Tsong Yueh Chen, Robert Graham Merkel

Research output: Chapter in Book/Report/Conference proceedingConference PaperResearchpeer-review

9 Citations (Scopus)
Original languageEnglish
Title of host publicationProceedings of the 2006 Australian Software Engineering Conference
EditorsJun Han, Mark Staples
Place of PublicationLos Alamitos CA USA
PublisherIEEE Computer Society
Pages300 - 305
Number of pages6
ISBN (Print)0769525512
Publication statusPublished - 2006
Externally publishedYes
EventAustralian Software Engineering Conference 2006 - Sydney, Australia
Duration: 18 Apr 200621 Apr 2006
Conference number: 17th
https://ieeexplore.ieee.org/xpl/conhome/10753/proceeding (Proceedings)

Conference

ConferenceAustralian Software Engineering Conference 2006
Abbreviated titleASWEC 2006
CountryAustralia
CitySydney
Period18/04/0621/04/06
Internet address

Cite this

Chen, T. Y., & Merkel, R. G. (2006). Efficient and effective random testing using the Voronoi diagram. In J. Han, & M. Staples (Eds.), Proceedings of the 2006 Australian Software Engineering Conference (pp. 300 - 305). IEEE Computer Society.