TY - JOUR
T1 - Effects of phosphorus doping on structural and optical properties of silicon nanocrystals in a SiO2 matrix
AU - Hao, Xiaojing
AU - Cho, Eun-Chel
AU - Scardera, Giuseppe
AU - Bellet-Amalric, Edith
AU - Bellet, Daniel Roland
AU - Shen, Yansong
AU - Huang, Shujuan
AU - Huang, Yidan
AU - Conibeer, Gavin
AU - Green, Martin Andrew
PY - 2009
Y1 - 2009
N2 - Promise of Si nanocrystals highly depends on tailoring their behaviour through doping. Phosphorus-doped silicon nanocrystals embedded in a silicon dioxide matrix have been realized by a co-sputtering process. The effects of phosphorus-doping on the properties of Si nanocrystals are investigated. Phosphorus diffuses from P-P and/or P-Si to P-O upon high temperature annealing. The dominant X-ray photoelectron spectroscopy P 2p signal attributable to Si-P and/or P-P (130 eV) at 1100 degrees C indicates that the phosphorus may exist inside Si nanocrystals. It is found that existence of phosphorus enhances phase separation of silicon rich oxide and thereby Si crystallization. In addition, phosphorus has a considerable effect on the optical absorption and photoluminescence properties as a function of annealing temperature
AB - Promise of Si nanocrystals highly depends on tailoring their behaviour through doping. Phosphorus-doped silicon nanocrystals embedded in a silicon dioxide matrix have been realized by a co-sputtering process. The effects of phosphorus-doping on the properties of Si nanocrystals are investigated. Phosphorus diffuses from P-P and/or P-Si to P-O upon high temperature annealing. The dominant X-ray photoelectron spectroscopy P 2p signal attributable to Si-P and/or P-P (130 eV) at 1100 degrees C indicates that the phosphorus may exist inside Si nanocrystals. It is found that existence of phosphorus enhances phase separation of silicon rich oxide and thereby Si crystallization. In addition, phosphorus has a considerable effect on the optical absorption and photoluminescence properties as a function of annealing temperature
UR - http://ac.els-cdn.com/S0040609009003058/1-s2.0-S0040609009003058-main.pdf?_tid=8f29819a-2e93-11e5-a0c2-00000aab0f6c&acdnat=1437364880_65246cd58101e2ea
U2 - 10.1016/j.tsf.2009.02.076
DO - 10.1016/j.tsf.2009.02.076
M3 - Article
VL - 517
SP - 5646
EP - 5652
JO - Thin Solid Films
JF - Thin Solid Films
SN - 0040-6090
IS - 19
ER -