Effect of surface pressure on the insulator to metal transition of a langmuir polyaniline monolayer

Jie Zhang, Anna L. Barker, Daniel Mandler, Patrick R. Unwin

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A remarkable change in the conductivity of a polyaniline (PAN) Langmuir monolayer in the conducting state, as a function of surface pressure, has been observed using scanning electrochemical microscopy (SECM). The film conductivity, as expressed by the SECM current response of a redox mediator, was measured in-situ in a Langmuir film balance. The conductivity of the film increases significantly with surface pressure, above a threshold value of ca. 20 mN m-1

Original languageEnglish
Pages (from-to)9312-9313
Number of pages2
JournalJournal of the American Chemical Society
Issue number31
Publication statusPublished - 6 Aug 2003
Externally publishedYes

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