Abstract
Vector field electron tomography (VFET) reconstructs vector fields based on phase maps recorded from two or more orthogonal tilt series. The tomographic reconstruction of vector fields involves considerations beyond those involved in the reconstruction of scalar fields. Here we examine the effect of initial magnetization orientation on reconstruction errors. The orientation of a magnetic particle affects the contrast in the phase maps. This, in turn, affects the accuracy of the reconstructed vector fields. We derive expressions that model the dependence of reconstruction errors on initial specimen orientation when using a filtered backprojection algorithm to reconstruct a vector potential from two tilt series. We compare these analytical results with those from numerical simulations. Our results can inform experimental procedures, such as sample preparation techniques and the choice of tilt series orientations. Specimen orientation can be a significant source of error in VFET, and our results can provide the means to minimize these errors.
| Original language | English |
|---|---|
| Pages (from-to) | 22366-22378 |
| Number of pages | 13 |
| Journal | Optics Express |
| Volume | 24 |
| Issue number | 20 |
| DOIs | |
| Publication status | Published - 3 Oct 2016 |
Cite this
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Effect of specimen orientation on the accuracy of vector field electron tomography. / Kemp, Zachary; Paganin, David; Petersen, Timothy; Morgan, Michael.
In: Optics Express, Vol. 24, No. 20, 03.10.2016, p. 22366-22378.Research output: Contribution to journal › Article › Research › peer-review
TY - JOUR
T1 - Effect of specimen orientation on the accuracy of vector field electron tomography
AU - Kemp, Zachary
AU - Paganin, David
AU - Petersen, Timothy
AU - Morgan, Michael
PY - 2016/10/3
Y1 - 2016/10/3
N2 - Vector field electron tomography (VFET) reconstructs vector fields based on phase maps recorded from two or more orthogonal tilt series. The tomographic reconstruction of vector fields involves considerations beyond those involved in the reconstruction of scalar fields. Here we examine the effect of initial magnetization orientation on reconstruction errors. The orientation of a magnetic particle affects the contrast in the phase maps. This, in turn, affects the accuracy of the reconstructed vector fields. We derive expressions that model the dependence of reconstruction errors on initial specimen orientation when using a filtered backprojection algorithm to reconstruct a vector potential from two tilt series. We compare these analytical results with those from numerical simulations. Our results can inform experimental procedures, such as sample preparation techniques and the choice of tilt series orientations. Specimen orientation can be a significant source of error in VFET, and our results can provide the means to minimize these errors.
AB - Vector field electron tomography (VFET) reconstructs vector fields based on phase maps recorded from two or more orthogonal tilt series. The tomographic reconstruction of vector fields involves considerations beyond those involved in the reconstruction of scalar fields. Here we examine the effect of initial magnetization orientation on reconstruction errors. The orientation of a magnetic particle affects the contrast in the phase maps. This, in turn, affects the accuracy of the reconstructed vector fields. We derive expressions that model the dependence of reconstruction errors on initial specimen orientation when using a filtered backprojection algorithm to reconstruct a vector potential from two tilt series. We compare these analytical results with those from numerical simulations. Our results can inform experimental procedures, such as sample preparation techniques and the choice of tilt series orientations. Specimen orientation can be a significant source of error in VFET, and our results can provide the means to minimize these errors.
UR - http://www.scopus.com/inward/record.url?scp=84989924865&partnerID=8YFLogxK
U2 - 10.1364/OE.24.022366
DO - 10.1364/OE.24.022366
M3 - Article
VL - 24
SP - 22366
EP - 22378
JO - Optics Express
JF - Optics Express
SN - 1094-4087
IS - 20
ER -