Abstract
In particle trapped near-field scanning optical microscopy (PTNSOM), a trapped small particle acts as a near-field probe to scatter an evanescent wave (EW) produced under total internal reflection of an incident laser beam. Such scattering leads to depolarization which result in a significant effect on PTNSOM. A study of this effect using a laser-trapped particle show that less depolarized scattered evanescent photons carry more information of an object. Based on measured degree of depolarization of the scattered EW, image contrast in PTNSOM can be enhanced and the phase shift of scattered EW between polarization states of an illumination beam be measured.
| Original language | English |
|---|---|
| Pages (from-to) | 175-177 |
| Number of pages | 3 |
| Journal | Applied Physics Letters |
| Volume | 75 |
| Issue number | 2 |
| DOIs | |
| Publication status | Published - 12 Jul 1999 |
| Externally published | Yes |