Double layer antireflection coating and window optimization for GaAsP/SiGe tandem on Si

Brianna Conrad; Tian Zhang; Anthony Lochtefeld; Andrew Gerger; Chris Ebert; Martin Diaz; Li Wang; Ivan Perez-Wurf; Allen Barnett

doi:10.1109/PVSC.2014.6925118

Double layer antireflection coating and window optimization for GaAsP/SiGe tandem on Si

Brianna Conrad, Tian Zhang, Anthony Lochtefeld, Andrew Gerger, Chris Ebert, Martin Diaz, Li Wang, Ivan Perez-Wurf, Allen Barnett

Research output: Chapter in Book/Report/Conference proceeding › Conference Paper › Other

7 Citations (Scopus)

Abstract

A double layer ARC for a GaAsP/SiGe tandem cell on Si is designed with a transfer matrix model. The importance of considering window thickness and material to be variable parameters in both design optimization and robustness investigation is demonstrated. In this process, optical constants of GaA_s.84P_.16, Ga_.59In_.41P, and Al_.65In_.35P are measured and used to estimate non-zero collection probability in the window layer. Experimental deposition of the ARC verifies the model and achieves a Spectral Weighted Reflectance of 1.9 %. Further modeling will better define the collection probability and suggest additional strategies for device efficiency improvement.

Original language	English
Title of host publication	2014 IEEE 40th Photovoltaic Specialist Conference
Editors	Angèle Reinders
Place of Publication	Piscataway NJ USA
Publisher	IEEE, Institute of Electrical and Electronics Engineers
Pages	1143-1147
Number of pages	5
ISBN (Electronic)	9781479943982
ISBN (Print)	9781479943999
DOIs	https://doi.org/10.1109/PVSC.2014.6925118
Publication status	Published - 2014
Externally published	Yes
Event	IEEE Photovoltaic Specialists Conference 2014 - Denver, United States of America Duration: 8 Jun 2014 → 13 Jun 2014 Conference number: 40th https://ieeexplore.ieee.org/xpl/conhome/6912652/proceeding (Proceedings - Part 1) https://ieeexplore.ieee.org/xpl/conhome/7587802/proceeding (Proceedings - Part 2)

Conference

Conference	IEEE Photovoltaic Specialists Conference 2014
Abbreviated title	PVSC 2014
Country/Territory	United States of America
City	Denver
Period	8/06/14 → 13/06/14
Internet address	https://ieeexplore.ieee.org/xpl/conhome/6912652/proceeding (Proceedings - Part 1) https://ieeexplore.ieee.org/xpl/conhome/7587802/proceeding (Proceedings - Part 2)

Keywords

III-V semiconductor materials
optical design
optical variables measurement
photovoltaic cells
thin films

UN SDGs

This output contributes to the following UN Sustainable Development Goals (SDGs)

Access to Document

10.1109/PVSC.2014.6925118

Cite this

Conrad, B., Zhang, T., Lochtefeld, A., Gerger, A., Ebert, C., Diaz, M., Wang, L., Perez-Wurf, I., & Barnett, A. (2014). Double layer antireflection coating and window optimization for GaAsP/SiGe tandem on Si. In A. Reinders (Ed.), 2014 IEEE 40th Photovoltaic Specialist Conference (pp. 1143-1147). IEEE, Institute of Electrical and Electronics Engineers. https://doi.org/10.1109/PVSC.2014.6925118

@inproceedings{b38a638cdfd447258e21f352d6806048,

title = "Double layer antireflection coating and window optimization for GaAsP/SiGe tandem on Si",

abstract = "A double layer ARC for a GaAsP/SiGe tandem cell on Si is designed with a transfer matrix model. The importance of considering window thickness and material to be variable parameters in both design optimization and robustness investigation is demonstrated. In this process, optical constants of GaAs.84P.16, Ga.59In.41P, and Al.65In.35P are measured and used to estimate non-zero collection probability in the window layer. Experimental deposition of the ARC verifies the model and achieves a Spectral Weighted Reflectance of 1.9 %. Further modeling will better define the collection probability and suggest additional strategies for device efficiency improvement.",

keywords = "III-V semiconductor materials, optical design, optical variables measurement, photovoltaic cells, thin films",

author = "Brianna Conrad and Tian Zhang and Anthony Lochtefeld and Andrew Gerger and Chris Ebert and Martin Diaz and Li Wang and Ivan Perez-Wurf and Allen Barnett",

year = "2014",

doi = "10.1109/PVSC.2014.6925118",

language = "English",

isbn = "9781479943999",

pages = "1143--1147",

editor = "Ang{\`e}le Reinders",

booktitle = "2014 IEEE 40th Photovoltaic Specialist Conference",

publisher = "IEEE, Institute of Electrical and Electronics Engineers",

address = "United States of America",

note = "IEEE Photovoltaic Specialists Conference 2014, PVSC 2014 ; Conference date: 08-06-2014 Through 13-06-2014",

url = "https://ieeexplore.ieee.org/xpl/conhome/6912652/proceeding, https://ieeexplore.ieee.org/xpl/conhome/7587802/proceeding",

}

Conrad, B, Zhang, T, Lochtefeld, A, Gerger, A, Ebert, C, Diaz, M, Wang, L, Perez-Wurf, I & Barnett, A 2014, Double layer antireflection coating and window optimization for GaAsP/SiGe tandem on Si. in A Reinders (ed.), 2014 IEEE 40th Photovoltaic Specialist Conference. IEEE, Institute of Electrical and Electronics Engineers, Piscataway NJ USA, pp. 1143-1147, IEEE Photovoltaic Specialists Conference 2014, Denver, Colorado, United States of America, 8/06/14. https://doi.org/10.1109/PVSC.2014.6925118

Double layer antireflection coating and window optimization for GaAsP/SiGe tandem on Si. / Conrad, Brianna; Zhang, Tian; Lochtefeld, Anthony et al.
2014 IEEE 40th Photovoltaic Specialist Conference. ed. / Angèle Reinders. Piscataway NJ USA: IEEE, Institute of Electrical and Electronics Engineers, 2014. p. 1143-1147.

Research output: Chapter in Book/Report/Conference proceeding › Conference Paper › Other

TY - GEN

T1 - Double layer antireflection coating and window optimization for GaAsP/SiGe tandem on Si

AU - Conrad, Brianna

AU - Zhang, Tian

AU - Lochtefeld, Anthony

AU - Gerger, Andrew

AU - Ebert, Chris

AU - Diaz, Martin

AU - Wang, Li

AU - Perez-Wurf, Ivan

AU - Barnett, Allen

N1 - Conference code: 40th

PY - 2014

Y1 - 2014

N2 - A double layer ARC for a GaAsP/SiGe tandem cell on Si is designed with a transfer matrix model. The importance of considering window thickness and material to be variable parameters in both design optimization and robustness investigation is demonstrated. In this process, optical constants of GaAs.84P.16, Ga.59In.41P, and Al.65In.35P are measured and used to estimate non-zero collection probability in the window layer. Experimental deposition of the ARC verifies the model and achieves a Spectral Weighted Reflectance of 1.9 %. Further modeling will better define the collection probability and suggest additional strategies for device efficiency improvement.

AB - A double layer ARC for a GaAsP/SiGe tandem cell on Si is designed with a transfer matrix model. The importance of considering window thickness and material to be variable parameters in both design optimization and robustness investigation is demonstrated. In this process, optical constants of GaAs.84P.16, Ga.59In.41P, and Al.65In.35P are measured and used to estimate non-zero collection probability in the window layer. Experimental deposition of the ARC verifies the model and achieves a Spectral Weighted Reflectance of 1.9 %. Further modeling will better define the collection probability and suggest additional strategies for device efficiency improvement.

KW - III-V semiconductor materials

KW - optical design

KW - optical variables measurement

KW - photovoltaic cells

KW - thin films

UR - http://www.scopus.com/inward/record.url?scp=84912081245&partnerID=8YFLogxK

U2 - 10.1109/PVSC.2014.6925118

DO - 10.1109/PVSC.2014.6925118

M3 - Conference Paper

AN - SCOPUS:84912081245

SN - 9781479943999

SP - 1143

EP - 1147

BT - 2014 IEEE 40th Photovoltaic Specialist Conference

A2 - Reinders, Angèle

PB - IEEE, Institute of Electrical and Electronics Engineers

CY - Piscataway NJ USA

T2 - IEEE Photovoltaic Specialists Conference 2014

Y2 - 8 June 2014 through 13 June 2014

ER -

Double layer antireflection coating and window optimization for GaAsP/SiGe tandem on Si

Abstract

Conference

Keywords

UN SDGs

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