Double layer antireflection coating and window optimization for GaAsP/SiGe tandem on Si

Brianna Conrad, Tian Zhang, Anthony Lochtefeld, Andrew Gerger, Chris Ebert, Martin Diaz, Li Wang, Ivan Perez-Wurf, Allen Barnett

Research output: Chapter in Book/Report/Conference proceedingConference PaperOther

6 Citations (Scopus)

Abstract

A double layer ARC for a GaAsP/SiGe tandem cell on Si is designed with a transfer matrix model. The importance of considering window thickness and material to be variable parameters in both design optimization and robustness investigation is demonstrated. In this process, optical constants of GaAs.84P.16, Ga.59In.41P, and Al.65In.35P are measured and used to estimate non-zero collection probability in the window layer. Experimental deposition of the ARC verifies the model and achieves a Spectral Weighted Reflectance of 1.9 %. Further modeling will better define the collection probability and suggest additional strategies for device efficiency improvement.

Original languageEnglish
Title of host publication2014 IEEE 40th Photovoltaic Specialist Conference
EditorsAngèle Reinders
Place of PublicationPiscataway NJ USA
PublisherIEEE, Institute of Electrical and Electronics Engineers
Pages1143-1147
Number of pages5
ISBN (Electronic)9781479943982
ISBN (Print)9781479943999
DOIs
Publication statusPublished - 2014
Externally publishedYes
EventIEEE Photovoltaic Specialists Conference 2014 - Denver, United States of America
Duration: 8 Jun 201413 Jun 2014
Conference number: 40th
https://ieeexplore.ieee.org/xpl/conhome/6912652/proceeding (Proceedings - Part 1)
https://ieeexplore.ieee.org/xpl/conhome/7587802/proceeding (Proceedings - Part 2)

Conference

ConferenceIEEE Photovoltaic Specialists Conference 2014
Abbreviated titlePVSC 2014
CountryUnited States of America
CityDenver
Period8/06/1413/06/14
Internet address

Keywords

  • III-V semiconductor materials
  • optical design
  • optical variables measurement
  • photovoltaic cells
  • thin films

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