Distance metric learning for feature-agnostic place recognition

Zetao Chen, Stephanie Lowry, Adam Jacobson, Zongyuan Ge, Michael Milford

Research output: Chapter in Book/Report/Conference proceedingConference PaperResearchpeer-review

9 Citations (Scopus)

Abstract

The recent focus on performing visual navigation and place recognition in changing environments has resulted in a large number of heterogeneous techniques each utilizing their own learnt or hand crafted visual features. This paper presents a generally applicable method for learning the appropriate distance metric by which to compare feature responses from any of these techniques in order to perform place recognition under changing environmental conditions. We implement an approach which learns to cluster images captured at spatially proximal locations under different conditions, separated from frames captured at different places. The formulation is a convex optimization, guaranteeing the existence of a global solution. We evaluate the general applicability of our method on two benchmark change datasets using three typical image pre-processing and feature types: GIST, Principal Component Analysis and learnt Convolutional Neural Network features. The results demonstrate that the distance metric learning approach uniformly improves single-image-based visual place recognition performance across all feature types. Furthermore, we demonstrate that this performance improvement is maintained when the sequence-based algorithm SeqSLAM is applied to the single-image place recognition results, leading to state-of-the-art performance.

Original languageEnglish
Title of host publication2015 IEEE/RSJ International Conference on Intelligent Robots and Systems (IROS 2015)
EditorsAlois Knoll
Place of PublicationPiscataway NJ USA
PublisherIEEE, Institute of Electrical and Electronics Engineers
Pages2556-2563
Number of pages8
ISBN (Electronic)9781479999941
ISBN (Print)9781479999958
DOIs
Publication statusPublished - 11 Dec 2015
Externally publishedYes
EventIEEE/RSJ International Conference on Intelligent Robots and Systems 2015 - Hamburg, Germany
Duration: 28 Sep 20152 Oct 2015

Publication series

NameIEEE International Conference on Intelligent Robots and Systems
PublisherIEEE, Institute of Electrical and Electronics Engineers
ISSN (Print)2153-0858
ISSN (Electronic)2153-0866

Conference

ConferenceIEEE/RSJ International Conference on Intelligent Robots and Systems 2015
Abbreviated titleIROS 2015
CountryGermany
CityHamburg
Period28/09/152/10/15

Keywords

  • Feature extraction
  • Image recognition
  • Lighting
  • Measurement
  • Principal component analysis
  • Training
  • Visualization

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