Discrete Angle Watermark Encoding and Recovery

Imants D Svalbe, Andrew Z Tirkel, Ron Van Schyndel

Research output: Chapter in Book/Report/Conference proceeding › Conference Paper › Research › peer-review

Original language	English
Title of host publication	Proceeding 15th International Conference on Pattern Recognition
Place of Publication	USA
Publisher	IEEE, Institute of Electrical and Electronics Engineers
Pages	246 - 249
Number of pages	4
Publication status	Published - 2000
Event	International Conference on Pattern Recognition 2000 - Barcelona, Spain Duration: 3 Sept 2000 → 7 Sept 2000 Conference number: 15th https://ieeexplore.ieee.org/xpl/conhome/7237/proceeding?isnumber=19577 (Proceedings)

Conference	International Conference on Pattern Recognition 2000
Abbreviated title	ICPR 2000
Country/Territory	Spain
City	Barcelona
Period	3/09/00 → 7/09/00
Internet address	https://ieeexplore.ieee.org/xpl/conhome/7237/proceeding?isnumber=19577 (Proceedings)

Cite this

@inproceedings{47853e7e51ab4b09ac21d28020b9cfac,

title = "Discrete Angle Watermark Encoding and Recovery",

author = "Svalbe, \{Imants D\} and Tirkel, \{Andrew Z\} and \{Van Schyndel\}, Ron",

year = "2000",

language = "English",

pages = "246 -- 249",

booktitle = "Proceeding 15th International Conference on Pattern Recognition",

publisher = "IEEE, Institute of Electrical and Electronics Engineers",

address = "United States of America",

note = "International Conference on Pattern Recognition 2000, ICPR 2000 ; Conference date: 03-09-2000 Through 07-09-2000",

url = "https://ieeexplore.ieee.org/xpl/conhome/7237/proceeding?isnumber=19577",

}

TY - GEN

T1 - Discrete Angle Watermark Encoding and Recovery

AU - Svalbe, Imants D

AU - Tirkel, Andrew Z

AU - Van Schyndel, Ron

N1 - Conference code: 15th

PY - 2000

Y1 - 2000

UR - https://www.scopus.com/pages/publications/0006580468

M3 - Conference Paper

SP - 246

EP - 249

BT - Proceeding 15th International Conference on Pattern Recognition

PB - IEEE, Institute of Electrical and Electronics Engineers

CY - USA

T2 - International Conference on Pattern Recognition 2000

Y2 - 3 September 2000 through 7 September 2000

ER -