Original language | English |
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Pages (from-to) | 12270 - 12278 |
Number of pages | 9 |
Journal | Journal of Physical Chemistry B |
Volume | 112 |
Issue number | 39 |
DOIs | |
Publication status | Published - 2008 |
Externally published | Yes |
Direct observation and analysis of annealing-induced microstructure at interface and its effect on performance improvement of organic thin film transistors
Qiaoliang Bao, Jun Li, Chang Ming Li, Zhili Dong, Zhisong Lu, Fang Qin, Cheng Gong, Jun Guo
Research output: Contribution to journal › Article › Research › peer-review
22
Citations
(Scopus)