Direct imaging of charged impurity density in common graphene substrates

K M Burson, William G Cullen, Shaffique Adam, Cory R Dean, Kenji Watanabe, Takashi Taniguchi, Philip Kim, Michael Fuhrer

    Research output: Contribution to journalArticleResearchpeer-review

    52 Citations (Scopus)
    Original languageEnglish
    Pages (from-to)3576 - 3580
    Number of pages5
    JournalNano Letters
    Volume13
    Issue number8
    DOIs
    Publication statusPublished - 2013

    Cite this

    Burson, K. M., Cullen, W. G., Adam, S., Dean, C. R., Watanabe, K., Taniguchi, T., Kim, P., & Fuhrer, M. (2013). Direct imaging of charged impurity density in common graphene substrates. Nano Letters, 13(8), 3576 - 3580. https://doi.org/10.1021/nl4012529