Dione: An integrated measurement and defect prediction solution

Bora Caglayan, Ayse Tosun Misirli, Gul Calikli, Ayse Bener, Turgay Aytac, Burak Turhan

Research output: Chapter in Book/Report/Conference proceedingConference PaperResearchpeer-review

9 Citations (Scopus)

Abstract

We present an integrated measurement and defect prediction tool: Dione. Our tool enables organizations to measure, monitor, and control product quality through learning based defect prediction. Similar existing tools either provide data collection and analytics, or work just as a prediction engine. Therefore, companies need to deal with multiple tools with incompatible interfaces in order to deploy a complete measurement and prediction solution. Dione provides a fully integrated solution where data extraction, defect prediction and reporting steps fit seamlessly. In this paper, we present the major functionality and architectural elements of Dione followed by an overview of our demonstration.

Original languageEnglish
Title of host publicationProceedings of the ACM SIGSOFT 20th International Symposium on the Foundations of Software Engineering, FSE 2012
DOIs
Publication statusPublished - 24 Dec 2012
Externally publishedYes
Event20th ACM SIGSOFT International Symposium on the Foundations of Software Engineering, FSE 2012 - Cary, NC, United States of America
Duration: 11 Nov 201216 Nov 2012

Conference

Conference20th ACM SIGSOFT International Symposium on the Foundations of Software Engineering, FSE 2012
CountryUnited States of America
CityCary, NC
Period11/11/1216/11/12

Keywords

  • measurement
  • software defect prediction
  • software tool

Cite this

Caglayan, B., Misirli, A. T., Calikli, G., Bener, A., Aytac, T., & Turhan, B. (2012). Dione: An integrated measurement and defect prediction solution. In Proceedings of the ACM SIGSOFT 20th International Symposium on the Foundations of Software Engineering, FSE 2012 https://doi.org/10.1145/2393596.2393619