Digital pathology: Identifying spongiosis in unstained histopathology specimen

Sanush Khyle Abeysekera, Karwei Nicholas Siew, Melanie Po-Leen Ooi, Ye Chow Kuang, Sharifah Syed Hassan, Serge Demidenko

Research output: Chapter in Book/Report/Conference proceedingConference PaperResearchpeer-review

Abstract

Histopathological specimens are prepped through a process called staining prior to analysis by the pathologist. Staining of a pathological specimen is a standard procedure used to increase the contrast between the cell and tissue structures against the background. Unfortunately, staining is a lengthy process that requires hours of preparation. Moreover, the chemicals used to perform the procedure can affect the specimen s characteristics. The entire problem of staining can be eliminated if detection and diagnosis can be performed on unstained specimen. However the low-contrast unstained samples can seriously affect the diagnosis reliability. Currently, no established technique exists for the detection and diagnosis of unstained histhopathological samples. This project aims to detect and diagnose spongiosis, a type of cerebral edema, in unstained histopathological samples taken from poultry brains. Success of this research is the first step towards detecting various classes of cerebral edema. It is a fast and accurate clinical tool that greatly enhances the analytic capability of the histopathological laboratory. The computer-aided diagnosis enables short turn-around time and higher consistency in the histopathological laboratory that services hospitals and clinics.
Original languageEnglish
Title of host publicationProceedings of the 2015 IEEE International Instrumentation and Measurement Technology Conference
EditorsMarcantonio Catelani
Place of PublicationNew Jersey USA
PublisherIEEE, Institute of Electrical and Electronics Engineers
Pages1970 - 1975
Number of pages6
ISBN (Print)9781479961139
DOIs
Publication statusPublished - 2015
EventIEEE International Instrumentation and Measurement Technology Conference 2015 - Pisa, Italy
Duration: 11 May 201514 May 2015
Conference number: 32nd
http://2015.imtc.ieee-ims.org/
https://ieeexplore.ieee.org/xpl/conhome/7137253/proceeding (Proceedings)

Conference

ConferenceIEEE International Instrumentation and Measurement Technology Conference 2015
Abbreviated titleI2MTC 2015
Country/TerritoryItaly
CityPisa
Period11/05/1514/05/15
OtherTheme: The "Measureable" of Tomorrow: Providing a Better Perspective on Complex Systems
Internet address

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