Determining oxide growth in thermal barrier coatings (TBCs) non-destructively using impedance spectroscopy

Xin Wang, Junfa Mei, Ping Xiao

Research output: Contribution to journalArticleResearchpeer-review

20 Citations (Scopus)

Abstract

The alumina layer growth in thermal barrier coatings (TBC) was investigated by impedance spectroscopy. The oxide layer growth was monitored nondestructively through modulus spectrum measurement. The TBCs investigated consists of the top coat yttria stabilized zirconia (YSZ) and the bond coat. A frequency response analyzer coupled with dielectric interface was used for impedance measurement. The results depicted efficient separation of electrical responses from different oxide layers in TBCs.

Original languageEnglish
Pages (from-to)47-49
Number of pages3
JournalJournal of Materials Science Letters
Volume20
Issue number1
DOIs
Publication statusPublished - 1 Jan 2001

Cite this