Determination of spherosiloxane cluster bonding to Si(100)-2 × 1 by scanning tunneling microscopy

K. S. Schneider, Z. Zhang, M. M. Banaszak Holl, B. G. Orr, U. C. Pernisz

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Abstract

Scanning tunneling microscopy is used to determine the bonding geometry of the spherosiloxane cluster, H8Si8O12, on Si(100)−2 × 1. The images obtained are consistent with monovertex bonding to the Si(100)− 2 × 1 surface via activation of a single Si-H bond. Filled and empty state images show good agreement with calculations of the electron density distribution of the cluster as well as the Ψ2 highest occupied molecular orbital and lowest unoccupied molecular orbital surface plots of the cluster.

Original languageEnglish
Pages (from-to)602-605
Number of pages4
JournalPhysical Review Letters
Volume85
Issue number3
DOIs
Publication statusPublished - 1 Jan 2000
Externally publishedYes

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