Determination of diffusion coefficients from semiintegrated d.c. and a.c. voltammetric data: overcoming the edge effect at macrodisc electrodes

Alexandr Simonov, Elena Mashkina, Peter J Mahon, Keith B Oldham, Alan Maxwell Bond

Research output: Contribution to journalArticleResearchpeer-review

7 Citations (Scopus)


Unless the area of an inlaid disc electrode is sufficiently large, and/or the scan rate fast enough, the ‘plateau’ of a semiintegrated d.c. voltammogram or aperiodic component of an a.c. voltammogram has a slope. This phenomenon, which has its origin in non-planar diffusion at the edge of the disc, interferes with an otherwise efficient method of determining diffusion coefficients. Methods of circumventing this difficulty are presented and tested with simulated and experimental data.
Original languageEnglish
Pages (from-to)110-116
Number of pages7
JournalJournal of Electroanalytical Chemistry
Publication statusPublished - 2015


  • Semiintegration
  • Convolution
  • Diffusion coefficient
  • D.c. voltammetry
  • A.c. voltammetry

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