Abstract
Experimental demonstration of small angle (0.8°-5°) direct UV-written X couplers in silica-on-silicon is presented. Maximum and minimum coupling ratios of 95% (±0.8%) and 1.9% (±1%), respectively, were recorded. The structures also display very low polarization and wavelength dependence. A typical excess loss of 1.0 dB (±0.5 dB) was recorded. Device modeling using the beam propagation method and an analytical model showed good agreement with experimental results over a broad crossing angle and wavelength range.
| Original language | English |
|---|---|
| Pages (from-to) | 6113-6118 |
| Number of pages | 6 |
| Journal | Applied Optics |
| Volume | 45 |
| Issue number | 24 |
| DOIs | |
| Publication status | Published - 20 Aug 2006 |
| Externally published | Yes |
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