Design and commissioning of an aberration-corrected ultrafast spin-polarized low energy electron microscope with multiple electron sources

Weishi Wan, Lei Yu, Lin Zhu, Xiaodong Yang, Zheng Wei, Jefferson Zhe Liu, Jun Feng, Kai Kunze, Oliver Schaff, Ruud Tromp, Wen Xin Tang

Research output: Contribution to journalArticleResearchpeer-review

9 Citations (Scopus)


We describe the design and commissioning of a novel aberration-corrected low energy electron microscope (AC-LEEM). A third magnetic prism array (MPA) is added to the standard AC-LEEM with two prism arrays, allowing the incorporation of an ultrafast spin-polarized electron source alongside the standard cold field emission electron source, without degrading spatial resolution. The high degree of symmetries of the AC-LEEM are utilized while we design the electron optics of the ultrafast spin-polarized electron source, so as to minimize the deleterious effect of time broadening, while maintaining full control of electron spin. A spatial resolution of 2 nm and temporal resolution of 10 ps (ps) are expected in the future time resolved aberration-corrected spin-polarized LEEM (TR-AC-SPLEEM). The commissioning of the three-prism AC-LEEM has been successfully finished with the cold field emission source, with a spatial resolution below 2 nm.

Original languageEnglish
Pages (from-to)89-96
Number of pages8
Publication statusPublished - 1 Mar 2017


  • Aberration correction
  • LEEM
  • STM

Cite this