Depth sectioning in scanning transmission electron microscopy based on core-loss spectroscopy

Adrian D'Alfonso, Scott Findlay, M Oxley, Stephen Pennycook, K van Bentham, Leslie Allen

Research output: Contribution to journalArticleResearchpeer-review

37 Citations (Scopus)


Recent and ongoing improvements in aberration correction have opened up the possibility of depth sectioning samples using the scanning transmission electron microscope in a fashion similar to the confocal scanning optical microscope. We explore questions of principle relating to image interpretability in the depth sectioning of samples using electron energy loss spectroscopy. We show that provided electron microscope probes are sufficiently fine and detector collection semi-angles are sufficiently large we can expect to locate dopant atoms inside a crystal. Furthermore, unlike high angle annular dark field imaging, electron energy loss spectroscopy can resolve dopants of smaller atomic mass than the supporting crystalline matrix
Original languageEnglish
Pages (from-to)17 - 28
Number of pages12
Issue number1
Publication statusPublished - 2007
Externally publishedYes

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