Deep level transient spectroscopy characterization of defects introduced in p-Si by electron beam deposition and proton irradiation

Cloud Nyamhere, A G M Das, F D Auret, M Hayes

    Research output: Contribution to journalConference articleResearchpeer-review

    2 Citations (Scopus)
    Original languageEnglish
    Pages (from-to)1 - 4
    Number of pages4
    JournalJournal of Physics: Conference Series
    Publication statusPublished - 2008

    Cite this