TY - JOUR
T1 - Dangling bonds in amorphous silicon investigated by multifrequency EPR
AU - Fehr, Matthias
AU - Schnegg, A.
AU - Rech, B.
AU - Lips, K.
AU - Astakhov, Oleksandr
AU - Finger, Friedhelm
AU - Freysoldt, C.
AU - Bittl, Robert
AU - Teutloff, Christian
PY - 2012/9/1
Y1 - 2012/9/1
N2 - Paramagnetic coordination defects in undoped hydrogenated amorphous silicon (a-Si:H) are studied using multifrequency pulsed electron-paramagnetic resonance (EPR) spectroscopy at S-, X-, Q- and W-band microwave frequencies (3.6, 9.7, 34, and 94 GHz, respectively). The improved spectral information extractable from a multifrequency fitting procedure allows us to conclude that the g tensor exhibits a rhombic splitting instead of axial symmetry. Our methods allow for precise and accurate determination of the g tensor principal values g x = 2.0079(2), g y = 2.0061(2) and g z = 2.0034(2) and their distribution parameters (g strain).
AB - Paramagnetic coordination defects in undoped hydrogenated amorphous silicon (a-Si:H) are studied using multifrequency pulsed electron-paramagnetic resonance (EPR) spectroscopy at S-, X-, Q- and W-band microwave frequencies (3.6, 9.7, 34, and 94 GHz, respectively). The improved spectral information extractable from a multifrequency fitting procedure allows us to conclude that the g tensor exhibits a rhombic splitting instead of axial symmetry. Our methods allow for precise and accurate determination of the g tensor principal values g x = 2.0079(2), g y = 2.0061(2) and g z = 2.0034(2) and their distribution parameters (g strain).
KW - Dangling bond
KW - Electron paramagnetic resonance
KW - g value
KW - Hydrogenated amorphous silicon
KW - Hyperfine interaction
UR - http://www.scopus.com/inward/record.url?scp=84865737306&partnerID=8YFLogxK
U2 - 10.1016/j.jnoncrysol.2011.12.105
DO - 10.1016/j.jnoncrysol.2011.12.105
M3 - Article
AN - SCOPUS:84865737306
SN - 0022-3093
VL - 358
SP - 2067
EP - 2070
JO - Journal of Non-Crystalline Solids
JF - Journal of Non-Crystalline Solids
IS - 17
ER -