Projects per year
Abstract
Refractive micro-optical components are typically limited in their surface profiles to focusing lenses (spherical or parabolic) and axicons (conical). For axi-symmetric lenses, the parabolic shape can be described as the distance from the axis to the power of two up to a scaling coefficient. The fabrication of three-dimensional surface reliefs in hard substrates is challenging even for such traditional optical elements like lenses and axicons. With the advent of focused ion beam milling systems with high-brightness inductively-coupled plasma sources rapid prototyping of optical devices without a constraint on the surface profile is becoming possible. Here we demonstrate the fabrication of cylindrical lenses with the profile-exponent between 1.5 and 2.5 using 200 nA of focused Xe ions to directly and rapidly carve the desired profiles. Furthermore, we fabricated the micro-optical elements directly in single-crystal lithium niobate - an exciting optoelectrical material with a high refractive index of >2.2. Due to its high inertness and resistance to most etchants, lithium niobate has the reputation of being difficult to use for the realization of photonic nanostructures, however, its gray-scale patterning by direct milling with noble and heavy Xe ions is straightforward. We analyzed the optical performance and beam-shaping properties of the fabricated microlenses by collecting series of intensity profiles at various planes and compared the experimental results with the numerical simulations. The results indicate that free-form optical elements allow enhancement of various optical properties, such as extension of the depth-of-focus and resolution improvement.
| Original language | English |
|---|---|
| Number of pages | 8 |
| DOIs | |
| Publication status | Published - 2020 |
| Event | SPIE: Advanced Fabrication Technologies for Micro/Nano Optics and Photonics XIII 2020 - San Francisco, United States of America Duration: 5 Feb 2020 → 6 Feb 2020 Conference number: 13th https://www.spiedigitallibrary.org/conference-proceedings-of-spie/11282.toc (Proceedings) |
Conference
| Conference | SPIE: Advanced Fabrication Technologies for Micro/Nano Optics and Photonics XIII 2020 |
|---|---|
| Abbreviated title | SPIE OPTO |
| Country/Territory | United States of America |
| City | San Francisco |
| Period | 5/02/20 → 6/02/20 |
| Internet address |
Keywords
- Depth of focus
- Focused ion beam
- Hybrid
- Kinoform
- Lithium niobate
- Microlens
Projects
- 1 Finished
-
ARC Centre of Excellence in Advanced Molecular Imaging
Whisstock, J. (Primary Chief Investigator (PCI)), Abbey, B. (Chief Investigator (CI)), Nugent, K. A. (Chief Investigator (CI)), Quiney, H. M. (Chief Investigator (CI)), Godfrey, D. I. (Chief Investigator (CI)), Heath, W. (Chief Investigator (CI)), Fairlie, D. (Chief Investigator (CI)), Chapman, H. (Partner Investigator (PI)), Peele, A. (Partner Investigator (PI)), Davey, J. (Partner Investigator (PI)) & Wittmann, A. (Project Manager)
30/06/14 → 31/03/21
Project: Research
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