Projects per year
Abstract
Refractive micro-optical components are typically limited in their surface profiles to focusing lenses (spherical or parabolic) and axicons (conical). For axi-symmetric lenses, the parabolic shape can be described as the distance from the axis to the power of two up to a scaling coefficient. The fabrication of three-dimensional surface reliefs in hard substrates is challenging even for such traditional optical elements like lenses and axicons. With the advent of focused ion beam milling systems with high-brightness inductively-coupled plasma sources rapid prototyping of optical devices without a constraint on the surface profile is becoming possible. Here we demonstrate the fabrication of cylindrical lenses with the profile-exponent between 1.5 and 2.5 using 200 nA of focused Xe ions to directly and rapidly carve the desired profiles. Furthermore, we fabricated the micro-optical elements directly in single-crystal lithium niobate - an exciting optoelectrical material with a high refractive index of >2.2. Due to its high inertness and resistance to most etchants, lithium niobate has the reputation of being difficult to use for the realization of photonic nanostructures, however, its gray-scale patterning by direct milling with noble and heavy Xe ions is straightforward. We analyzed the optical performance and beam-shaping properties of the fabricated microlenses by collecting series of intensity profiles at various planes and compared the experimental results with the numerical simulations. The results indicate that free-form optical elements allow enhancement of various optical properties, such as extension of the depth-of-focus and resolution improvement.
Original language | English |
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Number of pages | 8 |
DOIs | |
Publication status | Published - 2020 |
Event | SPIE: Advanced Fabrication Technologies for Micro/Nano Optics and Photonics XIII 2020 - San Francisco, United States of America Duration: 5 Feb 2020 → 6 Feb 2020 Conference number: 13th https://www.spiedigitallibrary.org/conference-proceedings-of-spie/11282.toc (Proceedings) |
Conference
Conference | SPIE: Advanced Fabrication Technologies for Micro/Nano Optics and Photonics XIII 2020 |
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Abbreviated title | SPIE OPTO |
Country/Territory | United States of America |
City | San Francisco |
Period | 5/02/20 → 6/02/20 |
Internet address |
Keywords
- Depth of focus
- Focused ion beam
- Hybrid
- Kinoform
- Lithium niobate
- Microlens
Projects
- 1 Finished
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ARC Centre of Excellence in Advanced Molecular Imaging
Whisstock, J., Abbey, B., Nugent, K., Quiney, H. M., Godfrey, D. I., Heath, W., Fairlie, D., Chapman, H., Peele, A., Davey, J. & Wittmann, A.
30/06/14 → 31/03/21
Project: Research