Cross-RCS based, high data capacity, chipless RFID system

Mohammad Zomorrodi, Nemai Chandra Karmakar

Research output: Chapter in Book/Report/Conference proceedingConference PaperResearchpeer-review

8 Citations (Scopus)
Original languageEnglish
Title of host publicationIEEE MTT-S International Microwave Symposium (IMS 2014)
EditorsSanjay Raman, Scott Barker
Place of PublicationPiscataway NJ USA
PublisherIEEE, Institute of Electrical and Electronics Engineers
Pages573 - 576
Number of pages4
ISBN (Print)9781479938698
DOIs
Publication statusPublished - 2014
EventIEEE MTT-S International Microwave Symposium 2014 - Tampa Convention Center, Tampa, United States of America
Duration: 1 Jun 20146 Jun 2014

Conference

ConferenceIEEE MTT-S International Microwave Symposium 2014
Abbreviated titleIMS 2014
CountryUnited States of America
CityTampa
Period1/06/146/06/14

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