| Original language | English |
|---|---|
| Title of host publication | Proceedings of the 3rd International Conference on Modeling and Analysis of Semiconductor Manufacturing |
| Editors | P Lendermann |
| Place of Publication | Singapore |
| Publisher | Singapore Institute of Manufacturing Technology (SIMTech) |
| Pages | 169 - 174 |
| Number of pages | 6 |
| ISBN (Print) | 9810541945 |
| Publication status | Published - 2005 |
| Event | International Conference on Modeling and Analysis of Semiconductor Manufacturing (MASM) - Singapore, Singapore Duration: 1 Jan 2005 → … |
Conference
| Conference | International Conference on Modeling and Analysis of Semiconductor Manufacturing (MASM) |
|---|---|
| City | Singapore |
| Period | 1/01/05 → … |
Cite this
Wallace, M., & Eisenberg, C. (2005). Constraint programming for improved wafer fabrication throughput. In P. Lendermann (Ed.), Proceedings of the 3rd International Conference on Modeling and Analysis of Semiconductor Manufacturing (pp. 169 - 174). Singapore: Singapore Institute of Manufacturing Technology (SIMTech).
@inproceedings{62a45b714efa410193156672e878bc51,
title = "Constraint programming for improved wafer fabrication throughput",
author = "Mark Wallace and Carlos Eisenberg",
year = "2005",
language = "English",
isbn = "9810541945",
pages = "169 -- 174",
editor = "P Lendermann",
booktitle = "Proceedings of the 3rd International Conference on Modeling and Analysis of Semiconductor Manufacturing",
publisher = "Singapore Institute of Manufacturing Technology (SIMTech)",
}
Wallace, M & Eisenberg, C 2005, Constraint programming for improved wafer fabrication throughput. in P Lendermann (ed.), Proceedings of the 3rd International Conference on Modeling and Analysis of Semiconductor Manufacturing. Singapore Institute of Manufacturing Technology (SIMTech), Singapore, pp. 169 - 174, International Conference on Modeling and Analysis of Semiconductor Manufacturing (MASM), Singapore, 1/01/05.
Constraint programming for improved wafer fabrication throughput. / Wallace, Mark; Eisenberg, Carlos.
Proceedings of the 3rd International Conference on Modeling and Analysis of Semiconductor Manufacturing. ed. / P Lendermann. Singapore : Singapore Institute of Manufacturing Technology (SIMTech), 2005. p. 169 - 174.Research output: Chapter in Book/Report/Conference proceeding › Conference Paper › Research › peer-review
TY - GEN
T1 - Constraint programming for improved wafer fabrication throughput
AU - Wallace, Mark
AU - Eisenberg, Carlos
PY - 2005
Y1 - 2005
M3 - Conference Paper
SN - 9810541945
SP - 169
EP - 174
BT - Proceedings of the 3rd International Conference on Modeling and Analysis of Semiconductor Manufacturing
A2 - Lendermann, P
PB - Singapore Institute of Manufacturing Technology (SIMTech)
CY - Singapore
ER -
Wallace M, Eisenberg C. Constraint programming for improved wafer fabrication throughput. In Lendermann P, editor, Proceedings of the 3rd International Conference on Modeling and Analysis of Semiconductor Manufacturing. Singapore: Singapore Institute of Manufacturing Technology (SIMTech). 2005. p. 169 - 174