Constraint programming for improved wafer fabrication throughput

Mark Wallace, Carlos Eisenberg

    Research output: Chapter in Book/Report/Conference proceedingConference PaperResearchpeer-review

    Original languageEnglish
    Title of host publicationProceedings of the 3rd International Conference on Modeling and Analysis of Semiconductor Manufacturing
    EditorsP Lendermann
    Place of PublicationSingapore
    PublisherSingapore Institute of Manufacturing Technology (SIMTech)
    Pages169 - 174
    Number of pages6
    ISBN (Print)9810541945
    Publication statusPublished - 2005
    EventInternational Conference on Modeling and Analysis of Semiconductor Manufacturing (MASM) - Singapore, Singapore
    Duration: 1 Jan 2005 → …

    Conference

    ConferenceInternational Conference on Modeling and Analysis of Semiconductor Manufacturing (MASM)
    CitySingapore
    Period1/01/05 → …

    Cite this

    Wallace, M., & Eisenberg, C. (2005). Constraint programming for improved wafer fabrication throughput. In P. Lendermann (Ed.), Proceedings of the 3rd International Conference on Modeling and Analysis of Semiconductor Manufacturing (pp. 169 - 174). Singapore: Singapore Institute of Manufacturing Technology (SIMTech).
    Wallace, Mark ; Eisenberg, Carlos. / Constraint programming for improved wafer fabrication throughput. Proceedings of the 3rd International Conference on Modeling and Analysis of Semiconductor Manufacturing. editor / P Lendermann. Singapore : Singapore Institute of Manufacturing Technology (SIMTech), 2005. pp. 169 - 174
    @inproceedings{62a45b714efa410193156672e878bc51,
    title = "Constraint programming for improved wafer fabrication throughput",
    author = "Mark Wallace and Carlos Eisenberg",
    year = "2005",
    language = "English",
    isbn = "9810541945",
    pages = "169 -- 174",
    editor = "P Lendermann",
    booktitle = "Proceedings of the 3rd International Conference on Modeling and Analysis of Semiconductor Manufacturing",
    publisher = "Singapore Institute of Manufacturing Technology (SIMTech)",

    }

    Wallace, M & Eisenberg, C 2005, Constraint programming for improved wafer fabrication throughput. in P Lendermann (ed.), Proceedings of the 3rd International Conference on Modeling and Analysis of Semiconductor Manufacturing. Singapore Institute of Manufacturing Technology (SIMTech), Singapore, pp. 169 - 174, International Conference on Modeling and Analysis of Semiconductor Manufacturing (MASM), Singapore, 1/01/05.

    Constraint programming for improved wafer fabrication throughput. / Wallace, Mark; Eisenberg, Carlos.

    Proceedings of the 3rd International Conference on Modeling and Analysis of Semiconductor Manufacturing. ed. / P Lendermann. Singapore : Singapore Institute of Manufacturing Technology (SIMTech), 2005. p. 169 - 174.

    Research output: Chapter in Book/Report/Conference proceedingConference PaperResearchpeer-review

    TY - GEN

    T1 - Constraint programming for improved wafer fabrication throughput

    AU - Wallace, Mark

    AU - Eisenberg, Carlos

    PY - 2005

    Y1 - 2005

    M3 - Conference Paper

    SN - 9810541945

    SP - 169

    EP - 174

    BT - Proceedings of the 3rd International Conference on Modeling and Analysis of Semiconductor Manufacturing

    A2 - Lendermann, P

    PB - Singapore Institute of Manufacturing Technology (SIMTech)

    CY - Singapore

    ER -

    Wallace M, Eisenberg C. Constraint programming for improved wafer fabrication throughput. In Lendermann P, editor, Proceedings of the 3rd International Conference on Modeling and Analysis of Semiconductor Manufacturing. Singapore: Singapore Institute of Manufacturing Technology (SIMTech). 2005. p. 169 - 174