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Computing marginal and conditional divergences between decomposable models with applications

Research output: Chapter in Book/Report/Conference proceeding › Conference Paper › Research › peer-review

Abstract

The ability to compute the exact divergence between two high-dimensional distributions is useful in many applications but doing so naively is intractable. Computing the alpha-beta divergence - a family of divergences that includes the Kullback-Leibler divergence and Hellinger distance - between the joint distribution of two decomposable models, i.e chordal Markov networks, can be done in time exponential in the treewidth of these models. However, reducing the dissimilarity between two high-dimensional objects to a single scalar value can be uninformative. Furthermore, in applications such as supervised learning, the divergence over a conditional distribution might be of more interest. Therefore, we propose an approach to compute the exact alpha-beta divergence between any marginal or conditional distribution of two decomposable models. Doing so tractably is non-trivial as we need to decompose the divergence between these distributions and therefore, require a decomposition over the marginal and conditional distributions of these models. Consequently, we provide such a decomposition and also extend existing work to compute the marginal and conditional alpha-beta divergence between these decompositions. We then show how our method can be used to analyze distributional changes by first applying it to a benchmark image dataset. Finally, based on our framework, we propose a novel way to quantify the error in contemporary superconducting quantum computers. Code for all experiments is available at: https://lklee.dev/pub/2023-icdm/code

Original languageEnglish
Title of host publicationProceedings - 23rd IEEE International Conference on Data Mining, ICDM 2023
EditorsGuihai Chen, Latifur Khan, Xiaofeng Gao, Meikang Qiu, Witold Pedrycz, Xindong Wu
Place of PublicationPiscataway NJ USA
PublisherIEEE, Institute of Electrical and Electronics Engineers
Pages239-248
Number of pages10
ISBN (Electronic)9798350307887
ISBN (Print)9798350307894
DOIs
Publication statusPublished - 2023
EventIEEE International Conference on Data Mining 2023 - Shanghai, China
Duration: 1 Dec 2023 → 4 Dec 2023
Conference number: 23rd
https://ieeexplore.ieee.org/xpl/conhome/10415628/proceeding (Proceedings)
https://www.cloud-conf.net/icdm2023/ (Website)

Publication series

NameProceedings - IEEE International Conference on Data Mining, ICDM
PublisherIEEE, Institute of Electrical and Electronics Engineers
ISSN (Print)1550-4786
ISSN (Electronic)2374-8486

Conference

ConferenceIEEE International Conference on Data Mining 2023
Abbreviated titleICDM 2023
Country/TerritoryChina
CityShanghai
Period1/12/23 → 4/12/23
Internet address

Keywords

  • alpha-beta divergence
  • Bayesian network
  • decomposable models
  • divergences
  • Hellinger distance
  • Kullback-Leibler divergence
  • Markov network
  • probabilistic graphical models

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