Composition measurement in substitutionally disordered materials by atomic resolution energy dispersive X-ray spectroscopy in scanning transmission electron microscopy

Zhen Chen, Daniel Taplin, Matthew Weyland, Leslie J Allen, Scott Findlay

Research output: Contribution to journalArticleResearchpeer-review

7 Citations (Scopus)

Abstract

The increasing use of energy dispersive X-ray spectroscopy in atomic resolution scanning transmission electron microscopy invites the question of whether its success in precision composition determination at lower magnifications can be replicated in the atomic resolution regime. In this paper, we explore, through simulation, the prospects for composition measurement via the model system of  AlxGa1-xAs, discussing the approximations used in the modelling, the variability in the signal due to changes in configuration at constant composition, and the ability to distinguish between different compositions. Results are presented in such a way that the number of X-ray counts, and thus the expected variation due to counting statistics, can be gauged for a range of operating conditions.

Original languageEnglish
Pages (from-to)52–62
Number of pages11
JournalUltramicroscopy
Volume176
DOIs
Publication statusPublished - 2017

Keywords

  • Atomic-resolution imaging
  • Elemental quantification
  • Energy dispersive X-ray spectroscopy (EDX)
  • Scanning transmission electron microscopy (STEM)

Cite this

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title = "Composition measurement in substitutionally disordered materials by atomic resolution energy dispersive X-ray spectroscopy in scanning transmission electron microscopy",
abstract = "The increasing use of energy dispersive X-ray spectroscopy in atomic resolution scanning transmission electron microscopy invites the question of whether its success in precision composition determination at lower magnifications can be replicated in the atomic resolution regime. In this paper, we explore, through simulation, the prospects for composition measurement via the model system of  AlxGa1-xAs, discussing the approximations used in the modelling, the variability in the signal due to changes in configuration at constant composition, and the ability to distinguish between different compositions. Results are presented in such a way that the number of X-ray counts, and thus the expected variation due to counting statistics, can be gauged for a range of operating conditions.",
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author = "Zhen Chen and Daniel Taplin and Matthew Weyland and Allen, {Leslie J} and Scott Findlay",
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Composition measurement in substitutionally disordered materials by atomic resolution energy dispersive X-ray spectroscopy in scanning transmission electron microscopy. / Chen, Zhen; Taplin, Daniel; Weyland, Matthew; Allen, Leslie J; Findlay, Scott.

In: Ultramicroscopy, Vol. 176, 2017, p. 52–62.

Research output: Contribution to journalArticleResearchpeer-review

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T1 - Composition measurement in substitutionally disordered materials by atomic resolution energy dispersive X-ray spectroscopy in scanning transmission electron microscopy

AU - Chen, Zhen

AU - Taplin, Daniel

AU - Weyland, Matthew

AU - Allen, Leslie J

AU - Findlay, Scott

PY - 2017

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AB - The increasing use of energy dispersive X-ray spectroscopy in atomic resolution scanning transmission electron microscopy invites the question of whether its success in precision composition determination at lower magnifications can be replicated in the atomic resolution regime. In this paper, we explore, through simulation, the prospects for composition measurement via the model system of  AlxGa1-xAs, discussing the approximations used in the modelling, the variability in the signal due to changes in configuration at constant composition, and the ability to distinguish between different compositions. Results are presented in such a way that the number of X-ray counts, and thus the expected variation due to counting statistics, can be gauged for a range of operating conditions.

KW - Atomic-resolution imaging

KW - Elemental quantification

KW - Energy dispersive X-ray spectroscopy (EDX)

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