Composition measurement in substitutionally disordered materials by atomic resolution energy dispersive X-ray spectroscopy in scanning transmission electron microscopy

Zhen Chen, Daniel Taplin, Matthew Weyland, Leslie J Allen, Scott Findlay

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9 Citations (Scopus)

Abstract

The increasing use of energy dispersive X-ray spectroscopy in atomic resolution scanning transmission electron microscopy invites the question of whether its success in precision composition determination at lower magnifications can be replicated in the atomic resolution regime. In this paper, we explore, through simulation, the prospects for composition measurement via the model system of  AlxGa1-xAs, discussing the approximations used in the modelling, the variability in the signal due to changes in configuration at constant composition, and the ability to distinguish between different compositions. Results are presented in such a way that the number of X-ray counts, and thus the expected variation due to counting statistics, can be gauged for a range of operating conditions.

Original languageEnglish
Pages (from-to)52–62
Number of pages11
JournalUltramicroscopy
Volume176
DOIs
Publication statusPublished - 2017

Keywords

  • Atomic-resolution imaging
  • Elemental quantification
  • Energy dispersive X-ray spectroscopy (EDX)
  • Scanning transmission electron microscopy (STEM)

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