Comparative determination of the α/β phase fraction in α+β-titanium alloys using X-ray diffraction and electron microscopy

M. M. Attallah, S. Zabeen, R. J. Cernik, M. Preuss

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24 Citations (Scopus)

Abstract

A comparison is made between the measured α/β phase fractions in Ti-6246 using X-ray diffraction (XRD) and electron microscopy. Image analysis of SEM and TEM images was compared to the phase fraction estimate obtained using electron backscattered diffraction, lab and high-energy synchrotron XRD. There was a good agreement between the electron microscopic and diffraction techniques, provided that the microstructural parameters of grain size and texture are estimated correctly when using quantitative Rietveld refinement.

Original languageEnglish
Pages (from-to)1248-1256
Number of pages9
JournalMaterials Characterization
Volume60
Issue number11
DOIs
Publication statusPublished - Nov 2009
Externally publishedYes

Keywords

  • Electron microscopy
  • Image analysis
  • Titanium alloys
  • X-ray diffraction

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