Abstract
A comparison is made between the measured α/β phase fractions in Ti-6246 using X-ray diffraction (XRD) and electron microscopy. Image analysis of SEM and TEM images was compared to the phase fraction estimate obtained using electron backscattered diffraction, lab and high-energy synchrotron XRD. There was a good agreement between the electron microscopic and diffraction techniques, provided that the microstructural parameters of grain size and texture are estimated correctly when using quantitative Rietveld refinement.
Original language | English |
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Pages (from-to) | 1248-1256 |
Number of pages | 9 |
Journal | Materials Characterization |
Volume | 60 |
Issue number | 11 |
DOIs | |
Publication status | Published - Nov 2009 |
Externally published | Yes |
Keywords
- Electron microscopy
- Image analysis
- Titanium alloys
- X-ray diffraction