Combining ATE and flying probe in-circuit test strategies for load board verification and test

Soh Ying Seah; Melanie Ooi; Ye Chow Kuang; Chee Sun See; Shanti Panchadcharam; Serge Demidenko

Combining ATE and flying probe in-circuit test strategies for load board verification and test

Soh Ying Seah, Melanie Ooi, Ye Chow Kuang, Chee Sun See, Shanti Panchadcharam, Serge Demidenko

Malaysia Sch of Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference Paper › Research › peer-review

Original language	English
Title of host publication	2009 IEEE International Instrumentation and Measurement Technology Conference (I2MTC 2009) Proceedings
Editors	Serge Demidenko
Place of Publication	New Jersey USA
Publisher	IEEE, Institute of Electrical and Electronics Engineers
Pages	1380 - 1385
Number of pages	6
ISBN (Print)	9781424433537
Publication status	Published - 2009
Event	IEEE International Instrumentation and Measurement Technology Conference 2009 - Singapore, Singapore Duration: 5 May 2009 → 7 May 2009 Conference number: 26th https://ieeexplore.ieee.org/xpl/conhome/5159258/proceeding (Proceedings)

Conference

Conference	IEEE International Instrumentation and Measurement Technology Conference 2009
Abbreviated title	I2MTC 2009
Country/Territory	Singapore
City	Singapore
Period	5/05/09 → 7/05/09
Internet address	https://ieeexplore.ieee.org/xpl/conhome/5159258/proceeding (Proceedings)

Cite this

Seah, S. Y., Ooi, M., Kuang, Y. C., See, C. S., Panchadcharam, S., & Demidenko, S. (2009). Combining ATE and flying probe in-circuit test strategies for load board verification and test. In S. Demidenko (Ed.), 2009 IEEE International Instrumentation and Measurement Technology Conference (I2MTC 2009) Proceedings (pp. 1380 - 1385). IEEE, Institute of Electrical and Electronics Engineers.

Seah, Soh Ying ; Ooi, Melanie ; Kuang, Ye Chow et al. / Combining ATE and flying probe in-circuit test strategies for load board verification and test. 2009 IEEE International Instrumentation and Measurement Technology Conference (I2MTC 2009) Proceedings. editor / Serge Demidenko. New Jersey USA : IEEE, Institute of Electrical and Electronics Engineers, 2009. pp. 1380 - 1385

@inproceedings{026e8a86731b46d1869595f11965ba4b,

title = "Combining ATE and flying probe in-circuit test strategies for load board verification and test",

author = "Seah, {Soh Ying} and Melanie Ooi and Kuang, {Ye Chow} and See, {Chee Sun} and Shanti Panchadcharam and Serge Demidenko",

year = "2009",

language = "English",

isbn = "9781424433537",

pages = "1380 -- 1385",

editor = "Serge Demidenko",

booktitle = "2009 IEEE International Instrumentation and Measurement Technology Conference (I2MTC 2009) Proceedings",

publisher = "IEEE, Institute of Electrical and Electronics Engineers",

address = "United States of America",

note = "IEEE International Instrumentation and Measurement Technology Conference 2009, I2MTC 2009 ; Conference date: 05-05-2009 Through 07-05-2009",

url = "https://ieeexplore.ieee.org/xpl/conhome/5159258/proceeding",

}

Seah, SY, Ooi, M, Kuang, YC, See, CS, Panchadcharam, S & Demidenko, S 2009, Combining ATE and flying probe in-circuit test strategies for load board verification and test. in S Demidenko (ed.), 2009 IEEE International Instrumentation and Measurement Technology Conference (I2MTC 2009) Proceedings. IEEE, Institute of Electrical and Electronics Engineers, New Jersey USA, pp. 1380 - 1385, IEEE International Instrumentation and Measurement Technology Conference 2009, Singapore, Singapore, 5/05/09.

Combining ATE and flying probe in-circuit test strategies for load board verification and test. / Seah, Soh Ying; Ooi, Melanie; Kuang, Ye Chow et al.
2009 IEEE International Instrumentation and Measurement Technology Conference (I2MTC 2009) Proceedings. ed. / Serge Demidenko. New Jersey USA: IEEE, Institute of Electrical and Electronics Engineers, 2009. p. 1380 - 1385.

Research output: Chapter in Book/Report/Conference proceeding › Conference Paper › Research › peer-review

TY - GEN

T1 - Combining ATE and flying probe in-circuit test strategies for load board verification and test

AU - Seah, Soh Ying

AU - Ooi, Melanie

AU - Kuang, Ye Chow

AU - See, Chee Sun

AU - Panchadcharam, Shanti

AU - Demidenko, Serge

N1 - Conference code: 26th

PY - 2009

Y1 - 2009

M3 - Conference Paper

SN - 9781424433537

SP - 1380

EP - 1385

BT - 2009 IEEE International Instrumentation and Measurement Technology Conference (I2MTC 2009) Proceedings

A2 - Demidenko, Serge

PB - IEEE, Institute of Electrical and Electronics Engineers

CY - New Jersey USA

T2 - IEEE International Instrumentation and Measurement Technology Conference 2009

Y2 - 5 May 2009 through 7 May 2009

ER -

Seah SY, Ooi M, Kuang YC, See CS, Panchadcharam S, Demidenko S. Combining ATE and flying probe in-circuit test strategies for load board verification and test. In Demidenko S, editor, 2009 IEEE International Instrumentation and Measurement Technology Conference (I2MTC 2009) Proceedings. New Jersey USA: IEEE, Institute of Electrical and Electronics Engineers. 2009. p. 1380 - 1385