Combined deadtime and pile-up correction for the MR-compatible BrainPET Scanner

Christoph Weirich, Jürgen Scheins, Michaela Gaens, Hans Herzog, N. Jon Shah

Research output: Chapter in Book/Report/Conference proceedingConference PaperResearchpeer-review

1 Citation (Scopus)

Abstract

Scanners in PET (Positron Emission Tomography) suffer from deadtime, i.e. the effect of sensitivity reduction with increasing count rates [1]. The reduction may be significant and its correction is a prerequisite for quantitative PET imaging. Conducting phantom studies with the Siemens 3T MR-BrainPET [2] it has been observed that deadtime is not a globally homogeneous effect but detector block dependent. Furthermore, a minor shift of crystal efficiencies on the same block due to pulse pile-up has been identified as a further component of this dynamic effect. This requires the treatment of deadtime on block and crystal level. Here, a block level deadtime correction combined with a pile-up correction is presented, implemented and assessed. The method is compared to the global deadtime correction method, as is standard in most commercial PET scanners.

Original languageEnglish
Title of host publication2013 IEEE Nuclear Science Symposium and Medical Imaging Conference, NSS/MIC 2013
PublisherIEEE, Institute of Electrical and Electronics Engineers
Number of pages2
ISBN (Print)9781479905348
DOIs
Publication statusPublished - 2013
Externally publishedYes
EventIEEE Nuclear Science Symposium and Medical Imaging Conference 2013 - Seoul, Korea, Republic of (South)
Duration: 27 Oct 20132 Nov 2013
Conference number: 60th

Conference

ConferenceIEEE Nuclear Science Symposium and Medical Imaging Conference 2013
Abbreviated titleNSS/MIC 2013
CountryKorea, Republic of (South)
CitySeoul
Period27/10/132/11/13

Cite this