Combined deadtime and pile-up correction for the MR-compatible BrainPET Scanner

Christoph Weirich; Jürgen Scheins; Michaela Gaens; Hans Herzog; N. Jon Shah

doi:10.1109/NSSMIC.2013.6829401

Combined deadtime and pile-up correction for the MR-compatible BrainPET Scanner

Christoph Weirich, Jürgen Scheins, Michaela Gaens, Hans Herzog, N. Jon Shah

Research output: Chapter in Book/Report/Conference proceeding › Conference Paper › Research › peer-review

1 Citation (Scopus)

Abstract

Scanners in PET (Positron Emission Tomography) suffer from deadtime, i.e. the effect of sensitivity reduction with increasing count rates [1]. The reduction may be significant and its correction is a prerequisite for quantitative PET imaging. Conducting phantom studies with the Siemens 3T MR-BrainPET [2] it has been observed that deadtime is not a globally homogeneous effect but detector block dependent. Furthermore, a minor shift of crystal efficiencies on the same block due to pulse pile-up has been identified as a further component of this dynamic effect. This requires the treatment of deadtime on block and crystal level. Here, a block level deadtime correction combined with a pile-up correction is presented, implemented and assessed. The method is compared to the global deadtime correction method, as is standard in most commercial PET scanners.

Original language	English
Title of host publication	2013 IEEE Nuclear Science Symposium and Medical Imaging Conference, NSS/MIC 2013
Publisher	IEEE, Institute of Electrical and Electronics Engineers
Number of pages	2
ISBN (Print)	9781479905348
DOIs	https://doi.org/10.1109/NSSMIC.2013.6829401
Publication status	Published - 2013
Externally published	Yes
Event	IEEE Nuclear Science Symposium and Medical Imaging Conference 2013 - Seoul, Korea, Republic of (South) Duration: 27 Oct 2013 → 2 Nov 2013 Conference number: 60th

Conference

Conference	IEEE Nuclear Science Symposium and Medical Imaging Conference 2013
Abbreviated title	NSS/MIC 2013
Country	Korea, Republic of (South)
City	Seoul
Period	27/10/13 → 2/11/13

Access to Document

10.1109/NSSMIC.2013.6829401

Link to publication in Scopus

Cite this

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title = "Combined deadtime and pile-up correction for the MR-compatible BrainPET Scanner",

abstract = "Scanners in PET (Positron Emission Tomography) suffer from deadtime, i.e. the effect of sensitivity reduction with increasing count rates [1]. The reduction may be significant and its correction is a prerequisite for quantitative PET imaging. Conducting phantom studies with the Siemens 3T MR-BrainPET [2] it has been observed that deadtime is not a globally homogeneous effect but detector block dependent. Furthermore, a minor shift of crystal efficiencies on the same block due to pulse pile-up has been identified as a further component of this dynamic effect. This requires the treatment of deadtime on block and crystal level. Here, a block level deadtime correction combined with a pile-up correction is presented, implemented and assessed. The method is compared to the global deadtime correction method, as is standard in most commercial PET scanners.",

author = "Christoph Weirich and J{\"u}rgen Scheins and Michaela Gaens and Hans Herzog and Shah, {N. Jon}",

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booktitle = "2013 IEEE Nuclear Science Symposium and Medical Imaging Conference, NSS/MIC 2013",

publisher = "IEEE, Institute of Electrical and Electronics Engineers",

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note = "IEEE Nuclear Science Symposium and Medical Imaging Conference 2013, NSS/MIC 2013 ; Conference date: 27-10-2013 Through 02-11-2013",

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Weirich, C, Scheins, J, Gaens, M, Herzog, H & Shah, NJ 2013, Combined deadtime and pile-up correction for the MR-compatible BrainPET Scanner. in 2013 IEEE Nuclear Science Symposium and Medical Imaging Conference, NSS/MIC 2013., 6829401, IEEE, Institute of Electrical and Electronics Engineers, IEEE Nuclear Science Symposium and Medical Imaging Conference 2013, Seoul, Korea, Republic of (South), 27/10/13. https://doi.org/10.1109/NSSMIC.2013.6829401

Combined deadtime and pile-up correction for the MR-compatible BrainPET Scanner. / Weirich, Christoph; Scheins, Jürgen; Gaens, Michaela; Herzog, Hans; Shah, N. Jon.

2013 IEEE Nuclear Science Symposium and Medical Imaging Conference, NSS/MIC 2013. IEEE, Institute of Electrical and Electronics Engineers, 2013. 6829401.

Research output: Chapter in Book/Report/Conference proceeding › Conference Paper › Research › peer-review

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