Chipless RFID based high resolution crack sensing through SWB technology

Shuvashis Dey, Prasanna Kalansuriya, Nemai Chandra Karmakar

Research output: Chapter in Book/Report/Conference proceedingConference PaperResearchpeer-review

8 Citations (Scopus)
Original languageEnglish
Title of host publication2014 IEEE International Microwave and RF Conference (IMaRC)
EditorsK J Vinoy, K Ghorbani
Place of PublicationDanvers MA USA
PublisherIEEE, Institute of Electrical and Electronics Engineers
Pages330 - 333
Number of pages4
ISBN (Print)9781479963164
Publication statusPublished - 2014
EventIEEE International RF and Microwave Conference 2014 - Bangalore, India
Duration: 1 Jan 2014 → …


ConferenceIEEE International RF and Microwave Conference 2014
Period1/01/14 → …

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