Chipless RFID based high resolution crack sensing through SWB technology

Shuvashis Dey, Prasanna Kalansuriya, Nemai Chandra Karmakar

Research output: Chapter in Book/Report/Conference proceedingConference PaperResearchpeer-review

14 Citations (Scopus)
Original languageEnglish
Title of host publication2014 IEEE International Microwave and RF Conference (IMaRC)
EditorsK J Vinoy, K Ghorbani
Place of PublicationDanvers MA USA
PublisherIEEE, Institute of Electrical and Electronics Engineers
Pages330 - 333
Number of pages4
ISBN (Print)9781479963164
DOIs
Publication statusPublished - 2014
EventIEEE MTT-S International Microwave and RF Conference 2014 - Bangalore, India
Duration: 15 Dec 201417 Dec 2014
https://ieeexplore.ieee.org/xpl/conhome/7023176/proceeding (Proceedings)

Conference

ConferenceIEEE MTT-S International Microwave and RF Conference 2014
Abbreviated titleIMaRC 2014
Country/TerritoryIndia
CityBangalore
Period15/12/1417/12/14
Internet address

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