Charge Accumulation in LDPE & XLPE conditioned at 80 DEG C under reduced pressure

Robert J Fleming; M Henriksen; J T Holboll

Charge Accumulation in LDPE & XLPE conditioned at 80 DEG C under reduced pressure

Robert J Fleming, M Henriksen, J T Holboll

Research output: Chapter in Book/Report/Conference proceeding › Conference Paper › Research › peer-review

Original language	English
Title of host publication	IEEE Dielectrics & Electrical Insulation Society
Place of Publication	NJ USA
Publisher	IEEE, Institute of Electrical and Electronics Engineers
Pages	19 - 22
Number of pages	4
ISBN (Print)	0-7803-3851-0
Publication status	Published - 1997
Event	IEEE Annual Report Conference on Electrical Insulation and Dielectric Phenomena (CEIDP) 1997 - Minneapolis, United States of America Duration: 19 Oct 1997 → 22 Oct 1997 https://ieeexplore.ieee.org/xpl/conhome/5021/proceeding (Proceedings)

Conference

Conference	IEEE Annual Report Conference on Electrical Insulation and Dielectric Phenomena (CEIDP) 1997
Abbreviated title	CEIDP 1997
Country/Territory	United States of America
City	Minneapolis
Period	19/10/97 → 22/10/97
Internet address	https://ieeexplore.ieee.org/xpl/conhome/5021/proceeding (Proceedings)

Cite this

@inproceedings{f2b6fd9ec2f04ba788c5bf7fe4363a73,

title = "Charge Accumulation in LDPE & XLPE conditioned at 80 DEG C under reduced pressure",

author = "Fleming, {Robert J} and M Henriksen and Holboll, {J T}",

year = "1997",

language = "English",

isbn = "0-7803-3851-0",

pages = "19 -- 22",

booktitle = "IEEE Dielectrics & Electrical Insulation Society",

publisher = "IEEE, Institute of Electrical and Electronics Engineers",

address = "United States of America",

note = "IEEE Annual Report Conference on Electrical Insulation and Dielectric Phenomena (CEIDP) 1997, CEIDP 1997 ; Conference date: 19-10-1997 Through 22-10-1997",

url = "https://ieeexplore.ieee.org/xpl/conhome/5021/proceeding",

}

Fleming, RJ, Henriksen, M & Holboll, JT 1997, Charge Accumulation in LDPE & XLPE conditioned at 80 DEG C under reduced pressure. in IEEE Dielectrics & Electrical Insulation Society. IEEE, Institute of Electrical and Electronics Engineers, NJ USA, pp. 19 - 22, IEEE Annual Report Conference on Electrical Insulation and Dielectric Phenomena (CEIDP) 1997, Minneapolis, Montana, United States of America, 19/10/97.

Charge Accumulation in LDPE & XLPE conditioned at 80 DEG C under reduced pressure. / Fleming, Robert J; Henriksen, M; Holboll, J T.
IEEE Dielectrics & Electrical Insulation Society. NJ USA: IEEE, Institute of Electrical and Electronics Engineers, 1997. p. 19 - 22.

Research output: Chapter in Book/Report/Conference proceeding › Conference Paper › Research › peer-review

TY - GEN

T1 - Charge Accumulation in LDPE & XLPE conditioned at 80 DEG C under reduced pressure

AU - Fleming, Robert J

AU - Henriksen, M

AU - Holboll, J T

PY - 1997

Y1 - 1997

M3 - Conference Paper

SN - 0-7803-3851-0

SP - 19

EP - 22

BT - IEEE Dielectrics & Electrical Insulation Society

PB - IEEE, Institute of Electrical and Electronics Engineers

CY - NJ USA

T2 - IEEE Annual Report Conference on Electrical Insulation and Dielectric Phenomena (CEIDP) 1997

Y2 - 19 October 1997 through 22 October 1997

ER -