Original language | English |
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Pages (from-to) | 116-117 |
Number of pages | 2 |
Journal | Microscopy and Microanalysis |
Volume | 20 |
Issue number | SUPPL 3 |
DOIs | |
Publication status | Published - 1 Aug 2014 |
Externally published | Yes |
Event | Microscopy and Microanalysis 2014 - Connecticut Convention Center, Hartford CT, United States of America Duration: 3 Aug 2014 → 7 Aug 2014 http://www.microscopy.org/MandM/2014/index.cfm |
Characterizing sub-lattice occupancies in B2 phases in high entropy metallic alloys using atomic resolution STEM-XEDS mapping
Robert E. A. Williams, Brian Welk, Bryan D. Esser, Gopal B. Viswanathan, Arda Genc, Mark Gibson, Leslie J. Allen, David W. McComb, Hamish L. Fraser
Research output: Contribution to journal › Meeting Abstract › peer-review
2
Citations
(Scopus)