Characterizing sub-lattice occupancies in B2 phases in high entropy metallic alloys using atomic resolution STEM-XEDS mapping

Robert E. A. Williams, Brian Welk, Bryan D. Esser, Gopal B. Viswanathan, Arda Genc, Mark Gibson, Leslie J. Allen, David W. McComb, Hamish L. Fraser

Research output: Contribution to journalMeeting Abstractpeer-review

2 Citations (Scopus)
Original languageEnglish
Pages (from-to)116-117
Number of pages2
JournalMicroscopy and Microanalysis
Volume20
Issue numberSUPPL 3
DOIs
Publication statusPublished - 1 Aug 2014
Externally publishedYes
EventMicroscopy and Microanalysis 2014 - Connecticut Convention Center, Hartford CT, United States of America
Duration: 3 Aug 20147 Aug 2014
http://www.microscopy.org/MandM/2014/index.cfm

Cite this