Characterization of thin films for X-ray and neutron waveguiding by X-ray reflectivity and atomic force microscopy

Daniele Pelliccia, S Kandasamy, M James

    Research output: Contribution to journalArticleResearchpeer-review

    2 Citations (Scopus)
    Original languageEnglish
    Pages (from-to)2416 - 2422
    Number of pages7
    JournalPhysica Status Solidi (A) - Applications and Materials Science
    Volume210
    Issue number11
    DOIs
    Publication statusPublished - 2013

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