Characterization of thin films for X-ray and neutron waveguiding by X-ray reflectivity and atomic force microscopy

Daniele Pelliccia, S Kandasamy, M James

Research output: Contribution to journal › Article › Research › peer-review

Original language	English
Pages (from-to)	2416 - 2422
Number of pages	7
Journal	Physica Status Solidi A: Applications and Materials Science
Volume	210
Issue number	11
DOIs	https://doi.org/10.1002/pssa.201330113
Publication status	Published - 2013

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@article{1281bef2f0d349ce9b5a08fdefeaff1e,

title = "Characterization of thin films for X-ray and neutron waveguiding by X-ray reflectivity and atomic force microscopy",

author = "Daniele Pelliccia and S Kandasamy and M James",

year = "2013",

doi = "10.1002/pssa.201330113",

language = "English",

volume = "210",

pages = "2416 -- 2422",

journal = "Physica Status Solidi A: Applications and Materials Science",

issn = "1862-6300",

publisher = "Wiley-Blackwell",

number = "11",

}

TY - JOUR

T1 - Characterization of thin films for X-ray and neutron waveguiding by X-ray reflectivity and atomic force microscopy

AU - Pelliccia, Daniele

AU - Kandasamy, S

AU - James, M

PY - 2013

Y1 - 2013

U2 - 10.1002/pssa.201330113

DO - 10.1002/pssa.201330113

M3 - Article

SN - 1862-6300

VL - 210

SP - 2416

EP - 2422

JO - Physica Status Solidi A: Applications and Materials Science

JF - Physica Status Solidi A: Applications and Materials Science

IS - 11

ER -